National Instruments Corporation

Chen Chang

Ahsan Aziz

Charles G Schroeder

John C Wawrzynek

Robert W Brodersen

Marcus K DaSilva

Paramjit S Banwait

Kevin B Camera

Gerardo Orozco Valdes

David M Crowley

Alexander Williams

Brian Jenkins

Ellery Cochell

Marcus K Dasilva

Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.

Over-the-air testing interface for phase array antennas

Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.

Over-the-air testing of millimeter wave integrated circuits with integrated antennas

Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections for input/output signals, power, and control and may also provide positioning. RF characteristics (e.g., including transmission, reception, and/or beamforming) of the DUT may be tested over-the-air using an array of antennas or probes.

Over-the-air test fixture using antenna array

A design environment for FPGA applications enables configuration of an FPGA platform to include a user design and one or more interface units, which the user design can use to access one or more external modules/devices without needing any particular knowledge of the structure and operation of such modules/devices. The interface unit corresponding to an external device/module, under the control of an operating environment, can establish a communication between the user design and the external module/device. An external processing module can use an interface unit to monitor and/or control a user design.

Systems and methods for FPGA development and operation

A computing platform includes an array of interconnected field programmable gate arrays (FPGAs), memory, and external input/output interfaces. The platform is in the form of a blade conforming to the Advanced Telecommunications Computing Architecture (ATCA) standard. The platform is especially useful for telecommunications and networking applications.

FPGA based ATCA (Advanced Telecommunications Computing Architecture) platform

Growing community of inventors

Fremont, CA, United States of America

Chen Chang