Xilinx, Inc.

Chee Chong Chan

Riyas Noorudeen Remla

Warren E Cory

Gourav Modi

Azarudin Abdulla

Jason R Bergendahl

A semiconductor device comprises a design under test (DUT), a testing interface, pattern generation circuitry, and pattern checker circuitry. The pattern generation circuitry is connected to the DUT and the testing interface. The pattern generation circuitry is configured to generate a test data sequence and control data based on configuration data received from the testing interface, and communicate the test data sequence and the control data to the DUT. The pattern checker circuitry is connected to the DUT and the testing interface. The pattern checker circuitry is configured to generate a comparison test sequence based on the configuration data received from the testing interface, receive resultant test data sequence and output control data from the DUT, and generate a first error signal based on a comparison of the resultant test data sequence and the comparison test sequence and a comparison of the output control data and the configuration data.

Configurable testing of semiconductor devices

Examples described herein provide a method for reducing lane-to-lane serial skew in an integrated circuit. In an example using a processor-based system, a maximum clock skew is determined from clock skews of respective lanes of a transmitter of the IC. Each of the clock skews corresponds to a skew of a clock signal of the respective lane relative to a same reference clock signal. A skew match amount is determined for each lane of the lanes of the transmitter. The skew match amount for a respective lane of the lanes is based on the maximum clock skew and the clock skew of the respective lane. Configuration data is generated to configure the transmitter to shift incoming data for each lane of the lanes based on the skew match amount for the respective lane.

Serial lane-to-lane skew reduction

Apparatus and associated methods relate to a dynamic lane-to-lane skew reduction technique having (a) a clocking architecture configured to provide a corresponding first delayed clock signal and a corresponding second delayed clock signal through a first and a second plurality of routing traces, respectively, and (b) a number of skew compensation circuits configured to process the corresponding first delayed clock signal and the corresponding second delayed clock signal to generate a corresponding user clock signal for a corresponding lane of a transmitter. In an illustrative example, a first routing trace may transmit a first delayed clock signal in a direction opposite to a second routing trace transmitting a second delayed clock signal. By implementing the technique, each transmitter lane may receive a corresponding user clock signal having substantially the same delay relative to a reference clock signal such that dynamic lane-to-lane skew may be advantageously reduced.

Circuit and method for dynamic clock skew compensation

Electrical circuits and associated methods relate to performing a phase alignment by providing N copies of clock alignment circuits, enabling and selecting different clock alignment circuits to achieve an initial phase alignment. In an illustrative example, a phase alignment circuit may include a first clock alignment circuit configured to find a first phase alignment point and a second clock alignment circuit configured to find a second phase alignment point. A control circuit may be configured to select a primary clock alignment circuit from the first clock alignment circuit and the second clock alignment circuit and generate a digital command signal to control a phase interpolator. In various embodiments, by setting the control circuit, the same phase alignment circuit may be used to perform phase alignments between clock domains with different frequencies.

Low latency data transfer technique for mesochronous divided clocks

An integrated circuit comprises programmable resources; a plurality of hard blocks; and a programmable connector coupled to the programmable resources, the plurality of hard blocks; wherein the programmable connector is configurable to route signals between a first hard block and a second hard block in a first mode of operation and to route signals between the first hard and the programmable resources in a second mode of operation.

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Singapore, Singapore

Chee Chong Chan