Institute of Microelectronics

Universitá Degli Studi Di Padova

Chee Cheong Wong

Shun Shen Wang

Filippo Romanato

Gianluca Ruffato

Husen Kartasamita Kang

Lee Kwang Hong

A method and a system for the enhancement of the sensitivity in surface plasmon resonance (SPR) sensors based metallic grating by exploiting the conical configuration is presented. We consider the propagation of surface plasmon polaritons (SPPs) excited by light from the visible to infrared spectrum range, incident on a plasmonic grating at different directions by varying both the zenith and azimuthal angles. For specific azimuthal angles, SPPs propagate in the grating plane perpendicular to the incident light momentum. This is the condition that allows increasing the number of different excited SPPs modes largely. We exploit this effect to increase the sensor sensitivity with the change of refractive index of thin film on the plasmonic grating surface. Polarization effects also contribute to a further modes enhancement and increase the sensitivity. A scheme for a lab-on-chip implementation of a system that allows a parallel detection in microfluidic channels has been shown.

Sensitivity enhancement in grating coupled surface plasmon resonance by azimuthal control

A method of facilitating wafer level burn-in testing. The method may utilize a rerouting process to connect input and output connections of each chip on the wafer to a bus network. The bus network may be used to conduct wafer level burn-in testing and does not change the AC/DC operating characteristics of the chips.

Wafer scale burn-in testing

Growing community of inventors

Singapore, Singapore

Chee Cheong Wong