Mediatek Corporation

Che-Hsien Huang

Yi-Chieh Lin

Chang-Lin Wei

Ying-Chou Shih

Sheng-Wei Lei

Jing-Hui Zhuang

Wun-Jian Lin

Shih-Chia Chiu

Chih-Yang Liu

This disclosure provides a test kit for testing a device under test (DUT) including a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having a nest and an interposer substrate installed under the nest.

Test kit for testing a device under test

A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having at least an interposer substrate sandwiched by a top socket and a nest.

Growing community of inventors

Hsinchu, Taiwan

Che-Hsien Huang