Texas Instruments Corporation

Charles Weinberger

Andrew Marshall

Lianrui Zhang

Madhu Sayala

C Keith Burgess

In a method and system for testing a transceiver communication device operating in a test mode, a transmitter output signal generated by a transmitter is adjusted and provided as a loop back to a receiver. The adjustment includes shifting a frequency and attenuating amplitude of the transmitter output signal to substantially match a predefined frequency and a predefined amplitude of a receiver input signal received by the receiver. A pass or fail status of the device is determined by comparing transmitted and received data.

Built in loop back self test in design or on test board for transceivers

In one aspect of the invention, a semiconductor die includes a plurality of resistive elements operable to receive a voltage differential between at least two of the resistive elements. The semiconductor die also includes a test circuit coupled to at least three tap points along the resistive elements. The test circuit is operable to measure a voltage at at least two of the tap points. A difference in the voltages between the at least two tap points is proportional to a resistance of the one or more resistive elements between the at least two tap points.

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McKinney, TX, United States of America

Charles Weinberger