Johnstech International Corporation

Charles Marks

Jathan D Edwards

Brian Halvorson

A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin () are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide () is maintained in alignment with the retainerby establishing a registration corner () and driving the guide into the corner by elastomers in at least one diagonally opposite corner.

Wafer level integrated circuit probe array and method of construction

A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin () are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (). The elastomer is precompressed from its natural rest state between a top () plate and a bottom (). Pre compression improves the resilient response of the pins. The pin crowns () are maintained relatively coplanar by the engagement of at least one flange (-) against an up-stop surfaceof plate, thereby insuring coplanarity of the crowns. The pin guide () is maintained in alignment with the retainerby establishing a registration corner () and driving the guide into the corner by elastomers in at least one diagonally opposite corner.

Wafer level integrated circuit contactor and method of construction

A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin () are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (). The elastomer is precompressed from its natural rest state between a top () plate and a bottom (). Pre compression improves the resilient response of the pins. The pin crows () are maintained relatively coplanar by the engagement of at least one flang (-) against an up-stop surfaceof plate, thereby insuring coplanarity of the crowns. The pin guide () is maintained in alignment with the retainerby establishing a registration corner () and driving the guide into the corner by elastomers in at least one diagonally opposite corner.

Growing community of inventors

Minneapolis, MN, United States of America

Charles Marks