Tdk Corporation

Sae Magnetics (h.k.) Limited

Charles Kin Chiu Wong

Noboru Yamanaka

Eric Cheuk Wing Leung

Leo Wai Kay Lau

Chris Chiu Ming Leung

Yoshihiro Kudo

Soji Koide

Yoshiyuki Mizoguchi

Susumu Nagatsuka

Provided is a magnetic reproducing method that enables a thin-film magnetic head including a head element for reading data signals which has a noise in its output due to a low temperature to bring out an excellent read characteristic in which the noise is suppressed even under the use environment with the low temperature. The magnetic reproducing method comprises the steps of: heating a head element for reading data signals which has a noise in its output due to a low temperature; and performing a read operation by using the head element for reading data signals under condition that the head element is increased in temperature.

Magnetic reproducing method for suppressing low temperature noise

Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.

Testing method of head element and magnetic recording and reproducing apparatus capable of head evaluating

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Hong Kong, China

Charles Kin Chiu Wong