Advanced Micro Devices Corporation

Charles K Bachand

Victoria Jean Bruce

Paul C Miranda

Kenneth Alan House

Kenneth J Morrissey

Leslie Stevenson

An integrated circuit device includes a first plurality of non-volatile memory locations such as fuses that supply programmed values corresponding to initially selected device features such as voltage, frequency, clock speed, and cache parameters. The device is programmed with a lock value in a second plurality of non-volatile memory locations. That lock value may be a randomly generated number that is unique for each device. After initial programming of the device, access to the device is prevented by appropriately programming access control. In order to unlock the device and modify device features, an unlock key value is supplied to the device. If the unlock key value correctly corresponds to the lock value, the device features can be modified. In that way device features can be modified, but security is maintained to prevent unauthorized modification to device features.

Method and apparatus to control access to device enable features

According to one aspect of the disclosure, the present invention provides methods and arrangements for milling the substrate of a semiconductor device to expose a selected region in the substrate, wherein the semiconductor device has a grid formed in the device to provide lateral and depth position indication during an etch/milling process. In an example implementation, the grid is three dimensional and is used during device analysis for navigation while removing substrate to access a selected circuit area via the backside of flip-chip device. As substrate is removed, the tools are aligned as indicated by the grid.

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Austin, TX, United States of America

Charles K Bachand