Analogic Corporation

Charles H Shaughnessy

John P O'Connor

David Rozas

Basak Ulker Karbeyaz

Aleksander Roshi

Ruvin Deych

Daniel Abenaim

Douglas Q Abraham

Sorin Marcovici

Nicholas A Accomando

Steven Neil Urchuk

Guy M Besson

Eric Francis Zanin

Kevin Cheng

Among other things, one or more techniques and/or systems for calibration of a radiation system to compute a gain correction(s) are provided. A calibration procedure is performed during which a portion of the detector array is shadowed by an object, causing the detector array to be non-uniformly exposed to radiation. A portion of a projection generated from the calibration procedure and indicative of radiation that did not traverse the object is separated from a portion of the projection indicative of radiation that did traverse the object, and a gain correction(s) is computed from the portion of the projection indicative of radiation that did not traverse the object (e.g., and is thus indicative of radiation that merely traversed air).

Gain calibration and correction in radiation system

Among other things, one or more techniques and/or systems are described for processing images yielded from an examination via radiation to reduce visible noise in the images. After an image is reconstructed, a noise contribution to the image (e.g., an amount of noise in the image) is estimated to determine a target noise contribution for the image. The target noise contribution for the image may vary based upon, among other things, dose of radiation, aspects or properties of an object being imaged, etc. The image is subsequently filtered using one or more filtering techniques to generate a filtered image, and a noise contribution to the filtered image is determined. When the noise contribution to the filtered image satisfies the target noise contribution (e.g., a sufficient amount of noise has been filtered out of the image), the filtered image is combined with the reconstructed image to generate a blended image.

Noise reduction in radiation image

Among other things, a tire inspection system and method are provided. A radiation source and a detector array are configured to rotate about an axis of rotation. During a first examination of a tire, the tire has a first orientation relative to the axis of rotation, and during a second examination, the tire has a second orientation relative to the axis of rotation. For example, between the first examination and the second examination, the tire is at least one of shifted with respect to the axis of rotation or rotated about a tire rotation axis (e.g., perpendicular to the axis of rotation) to change the orientation of the tire relative to the axis of rotation. In this manner, imagery of the tire may be developed, which can be inspected to identify irregularities, etc., in the tire, for example.

System and method for tire inspection

One or more techniques and/or systems are described for inspecting an object, such as a tire. The system comprises a radiation imaging system configured to examine the object via radiation to generate a radiation image depicting an interior aspect of the object and a machine vision system configured to measure visible light and/or infrared wavelengths to generate a vision image depicting an exterior aspect of the object. The radiation image and the vision image may be correlated to facilitate an inspection of the object which includes an inspection of the exterior aspect as well as the interior aspect.

Inspection system

Among other things, one or more techniques and/or systems are described for measuring the attenuation of a line integral through an object via a photon counting cell () and via an energy integrating cell (). That is, an imaging apparatus is provided that comprises a radiation source () and a detector array (). The detector array is comprised of both photon counting cells () and energy integrating cells () arranged such that, during an examination of the object, attenuation of a line integral through the object is measured by at least one photon counting cell and at least one energy integrating cell. In this way, at least two substantially complete views of an object may be acquired, one from measurements yielded from the photon counting cell (and other photon counting cells) and one from measurements yielded from the energy integrating cell (and other energy integrating cells).

Detector array comprising energy integrating and photon counting cells

A scanner () includes a radiation source () that emits radiation that traverses a scanning region and a detector array (), including a line of detectors (), that detects radiation traversing the scanning region, wherein the radiation source and the detector array are located on opposing sides of the scanning region. The scanner further includes a mover () configured to move an object through the scanning region when scanning the object. The line of detectors () is configured to move in a plane, which is substantially parallel to the scanning region, in coordination with the mover moving the object, thereby creating a plane of detection for scanning the object.

Security scanner

One or more techniques and/or systems are described herein for cleaning a portion of a radiographic examination apparatus whereon debris may accumulate. Typically, the portion being cleaned is within a scanning field of the radiographic examination device (e.g., within a portion of the radiographic examination device through which radiation traverses). Activation of a cleaning mechanism, or a portion thereof, may be timed to miss radiation emitted during a scan, and thus not interfere with a scan. Also, the cleaning mechanism, or a portion thereof, may be located so as to not attenuate radiation. If radiation is attenuated by the cleaning mechanism corrective techniques can be implemented to account for such attenuation.

Cleaning apparatus and/or cleaning techniques for use with a radiation system

Among other things, one or more systems and/or techniques for integrating electrical charge yielded from an indirect conversion detector array of a pulsating radiation system are provided. The integration begins during a resting period between a first and second pulse and ends before the second pulse is emitted. Electrical charge that is measured during a resting period is integrated, while electrical charge measured during a pulse is not integrated. In this way, parasitic contributions caused by the direct interaction of radiation photons with a photodiode are reduced and a quantum efficiency of the indirect conversion detector array is increased, for example. Moreover, the period of integration can be adjusted such that a voltage gain related to the indirect conversion detector array can be varied to a predetermined level.

X-ray detector with improved quantum efficiency

An operation room may comprise both an object scanning apparatus for examining an object using x-ray radiation and an irradiation component for treating an object using particle radiation. A support article upon which the object may reside during (both) the examination and treatment may be configured to rotate about an axis substantially perpendicular to a plane through which x-ray radiation travels, may be configured to tilt with respect to the axis, and/or may be configured to yaw with respect to the axis. In this way, the relative orientation of the support article and the object remain substantially constant during the examination and treatment to facilitate treating a desired area of the object.

Computed tomography examination and particle therapy treatment

One or more systems and/or techniques are disclosed herein for determining the orientation of a focal spot of a radiation source based upon shadows that are imposed on channels of a detector array from an anti-scatter grid. The anti-scatter grid is comprised of one or more anti-scatter plates that are focused on a point other than an intended focal spot of the radiation source. Such anti-scatters plates cast shadows on the detector array (even when the focal spot is located at the intended focal spot). By measuring changes in the signals generated by channels of the detector array that detect the shadows, it may be determined how the orientation of the focal spot has changed throughout an examination or between a calibration scan and an examination scan, for example.

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Hamilton, MA, United States of America

Charles H Shaughnessy