International Business Machines Corporation

Charles F Pells

Michael F McAllister

Gerhard H Ruehle

Stephan R Richter

Klaus K Kempter

Chin-Long Chen

William Wu Shen

Mu-Yue Hsiao

Surasak K O'Trakoun

A method and apparatus of interconnecting with a system board is presented. A system board having a metal stiffener mounted thereon is provided with an opening in the stiffener to provide access to an area of interest on the system board. A probe test assembly is positioned a the opening and secured to the stiffener when testing is desired to provide access to the pins of the device under test (e.g., a Multi Chip Module (MCM) on the system board). Alternatively, a system enhancement device, such as an MCM or Single Chip Module (SCM) having additional Central Processing Units (CPU's) or other features, may be installed on the system board at the opening in the stiffener to enhance the function of the system board. Another alternate includes an interface assembly positioned at the opening in the stiffener. A cover is positioned at the opening and secured to the stiffener at all other times.

Method and apparatus of interconnecting with a system board

Method of interconnecting with a system board

A method and apparatus of interconnecting with a system board is presented. A system board having a metal stiffener mounted thereon is provided with an opening in the stiffener to provide access to an area of interest on the system board. A probe test assembly is positioned at the opening and secured to the stiffener when testing is desired to provide access to the pins of the device under test (e.g., a Multi Chip Module (MCM) on the system board). Alternatively, a system enhancement device, such as a MCM or Single Chip Module (SCM) having additional Central Processing Units (CPU's) or other features, may be installed on the system board at the opening in the stiffener to enhance the function of the system board. Another alternate includes an interface assembly positioned at the opening in the stiffener. A cover is positioned at the opening and secured to the stiffener at all other times.

Method and apparatus for enhancing a system board

System interface assembly and method

A high frequency probe is presented. The probe comprises a probe body having a coaxial resilient double ended probe element attached thereto by an adaptor. A locking pin is attached to the probe adaptor and extends parallel to the probe element, however, it is slightly shorter as the locking pin should not contact any pins of the device being probed. The locking pin serves to hold the probe in place. Alternatively, a high frequency differential probe is presented. The high frequency differential probe comprises a base having a first pair of opposing spring steel plates and a second adjacent pair of opposing spring steel plates connected thereto. The first pair of spring plates are also connected to a first probe adaptor and the second pair of spring plates are also connected to a second probe adaptor. A first probe body is mounted at an angle to the first adaptor and a second probe body is mounted at an angle to the second adaptor. A first coaxial resilient double ended probe element connected to the first probe body by the first adaptor and a second coaxial resilient double ended probe element connected to the second probe body by the second adaptor.

High frequency probe

A barcode scanner, which is particularly suitable for reading barcode information from surfaces having various reflective properties, includes a light intensity control for the light source of the barcode scanner. The light intensity control preferably comprises a means for ramping voltage and a summing circuit which allows the current flowing through the light source to be controlled. In addition, the light intensity control utilizes a clocking means which controls the rate of voltage ramping.

Barcode scanner with adjustable light source intensity

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Wappingers Falls, NY, United States of America

Charles F Pells