Hefei University of Technology

Chaolong Zhang

Yigang He

Lei Zuo

Baiqiang Yin

Bing Li

Zhigang Li

Deqin Zhao

Wei He

Zhijie Yuan

Lifen Yuan

Zhen Cheng

Ying Long

Lei Wu

Peng Chen

Shuai Luo

Yesheng Sun

Sheng Xiang

A method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation, includes steps of: step (1) acquiring a fault response voltage signal of an analog circuit; step (2) carrying out wavelet packet transform on the collected signal, and calculating a wavelet packet coefficient energy value as a characteristic parameter; step (3) utilizing a quantum particle swarm optimization algorithm to optimize a regularization parameter and kernel parameter of vector-valued regularized kernel function approximation, and training a fault diagnosis model; and step (4) utilizing the trained diagnosis model to recognize circuit faults.

Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation

A vector-valued regularized kernel function approximation (VVRKFA) based fault diagnosis method for an analog circuit comprises the following steps: (1) obtaining fault response voltage signals of an analog circuit; (2) performing wavelet packet transform on the collected signals, and calculating wavelet packet coefficient energy values as feature parameters; (3) optimizing regularization parameters and kernel parameters of VVRKFA by using a quantum particle swarm optimization algorithm and training a fault diagnosis model; and (4) identifying a circuit fault by using the trained diagnosis model. In the invention, the classification performance of the VVRKFA method is superior to other classification algorithms, and optimization of parameters by the quantum particle swarm optimization (QPSO) algorithm is also superior to the traditional method of obtaining parameters. The fault diagnosis method provided by the invention can efficiently diagnose the component faults of the circuit, including soft faults and hard faults.

Vector-valued regularized kernel function approximation based fault diagnosis method for analog circuit

An analog circuit fault mode classification method comprises the following implementation steps: (1) collecting M groups of voltage signal sample vectors Vto each of fault modes Fof the analog circuit by using a data collection board; (2) sequentially extracting fault characteristic vectors Vof the voltage signal sample vectors Vby using subspace projection; (3) standardizing the extracted fault characteristic vectors Vto obtain standardized fault characteristic vectors; (4) constructing a fault mode classifier based on a support vector machine, inputting the standardized fault characteristic vectors, performing learning and training on the classifier, and determining structure parameters of the classifier; and (5) completing determination of fault modes according to fault mode determination rules. The fault mode classifier of the present invention is simple in learning and training and reliable in mode classification accuracy.

Analog circuit fault mode classification method

An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an orthogonal Haar wavelet filter set; (4) extracting the feature factor of the prior sample fault modes; (5) extracting a fault-mode-to-be-tested feature factor; (6) computing a correlation coefficient matrix and correlation metric parameters between the feature factor of the prior sample fault modes and the feature factor of the fault-mode-to-be-tested; and (7) determining a fault mode according to a maximal correlation principle by comparing the correlation metric parameters. The method can convert a single signal into a plurality of signals without losing original measurement information, and extract an independent fault mode feature factor reflecting variations of a circuit structure in different fault modes, can be used to study an associated mode determination rule and successfully complete classification of circuit fault modes.

Analog circuit fault diagnosis method using single testable node

A method for predicting a remaining useful life of a lithium battery based on a wavelet denoising and a relevance vector machine, relating to a method for estimating health condition and predicting remaining useful life of lithium battery, includes steps of: (1) obtaining health condition data of each of charge-discharge cycles of the lithium battery by measurement; (2) processing capacity data measured of the lithium battery with wavelet double denoising; (3) calculating a capacity threshold where the lithium battery fails; (4) referring to capacity data and charge-discharge cycle data of the lithium battery, applying a differential evolution algorithm for optimizing a width factor of the relevance vector machine; and (5) predicting the remaining useful life of the lithium battery with the relevance vector machine optimized by the differential evolution algorithm. The method is simple and effective, which can accurately predict remaining useful life of lithium battery.

Method for predicting remaining useful life of lithium battery based on wavelet denoising and relevance vector machine

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Anhui, China

Chaolong Zhang