Intel Corporation

Chao Yan Tang

Kuljit Singh Bains

Murugasamy K Nachimuthu

Rajat Agarwal

Cong Li

Mariusz Oriol

Xiaoming Du

Shen Zhou

Maciej Lawniczak

A system can predict memory device failure through identification of correctable error patterns based on the memory architecture. The failure prediction can thus account for the circuit-level of the memory rather than the mere number or frequency of correctable errors. A failure prediction engine correlates hardware configuration of the memory device with correctable errors (CEs) detected in data of the memory device to predict an uncorrectable error (UE) based on the correlation.

Uncorrectable memory error prediction

Growing community of inventors

Shanghai, China

Chao Yan Tang