Industrial Technology Research Institute

Au Optronics Corporation

Chunghwa Picture Tubes, Ltd.

Hannstar Display Corporation

Chi Mei Optoelectronics Corporation

Taiwan Tft Lcd Association

Chao-Nan Chen

Ming-Chun Hsyu

Wen Tsuei

Fang-Chen Luo

Shuo-Wei Liang

Shin-Chuan Chiang

Chin-Chih Yu

A method for fabricating a thin film transistor is provided. A gate is formed on a substrate. A gate insulating layer is formed on the substrate to cover the gate. A metal oxide material layer is formed on the gate insulating layer. A photoresist layer is formed on the metal oxide material layer, in which a thickness of the photoresist layer above the gate is larger than that of the photoresist layer above two sides adjacent to the gate. A portion of the metal oxide material layer is removed to form a metal oxide active layer by using the photoresist layer as a mask. The photoresist layer above the two sides adjacent to the gate is removed and the remaining photoresist layer covers a portion of the metal oxide active layer. A source and a drain are formed on the metal oxide active layer covered by the photoresist layer.

Method for fabricating thin film transistor

A method for determining the accuracy of the estimated position for a target device in a wireless system includes the computation of a confidence index. In the online location determining phase, after knowing the observations of the radio signal for a target device, the target device's probability distribution of location and its motion model are combined to calculate the position uncertainty, thereby giving the confidence index of this location estimate. The invention determines the location probability distribution, and calculates the uncertainty of the location probability distribution and the possible maximum uncertainty under the current situation. Based on these uncertainties, this invention determines the confidence index of the radio signal. The confidence may be regarded as a quantity that the location uncertainty can be excluded in the location prediction.

Method and apparatus for determining accuracy of the estimated location for a target in a wireless system

Disclosed is a method and apparatus for determining the new sample points of the location determination system in a wireless environment. In the training phase, after knowing the distribution of the observed radio signal of a location for a target device, the uncertainty of the probability distribution of the received radio signal is analyzed by a location probability distribution model. The radio signal distribution differences are calculated, and the penalties between the location in question and its nearby locations are also calculated, thereby determining whether a location is the candidate of new sample points or the recalibration points. This invention has nothing to do with decision rules and will not undergo the problems of choosing inappropriate decision rules. It also provides a penalty model for generating penalty of error prediction from one location to another location, which can as well easily mitigate the problem on the sample points with the double-role attribute of the border line.

Method and apparatus for determining the new sample points of the location determination system in a wireless environment

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Taichung, Taiwan

Chao-Nan Chen