Chunghwa Precision Test Tech. Co., Ltd.

Chao-Hui Tseng

Wei-Jhih Su

Hao-Yen Cheng

Rong-Yang Lai

Kai-Chieh Hsieh

Mei-Hui Chen

Wen-Tsung Lee

Hsien-Yu Wang

Vel Sankar Ramachandran

A light absorption probe includes an arm segment, a main segment located at one side of the arm segment, a testing segment connected to another side of the arm segment, and a light absorption coating layer. The main segment has a soldering end portion and an extending end portion respectively located at two opposite sides thereof along a predetermined direction. The testing segment has an upright shape along the predetermined direction and includes a pinpoint portion and an upright portion that connects the pinpoint portion and the arm segment. The light absorption coating layer covers the upright portion, and the pinpoint portion is exposed from the light absorption coating layer. Through the light absorption coating layer, the testing segment only forms an observation point at the pinpoint portion in an observation process of a detection apparatus.

Cantilever probe card device and light absorption probe

A vertical probe card device and a fence-like probe thereof are provided. The fence-like probe has a probe length within a range from 5 mm to 8 mm. The fence-like probe includes a fence-like segment, a connection segment, and a testing segment. The fence-like segment has an elongated shape defining a longitudinal direction, and the fence-like segment has a penetrating slot and a first protrusion. The penetrating slot is formed along the longitudinal direction and has a length greater than 65% of the probe length. The first protrusion extends from one of two long walls of the penetrating slot by a first predetermined width and is spaced apart from another one of the two long walls of the penetrating slot by a first gap. The connection segment and the testing segment are respectively connected to two end portions of the fence-like segment.

Vertical probe card device and fence-like probe thereof

A cantilever probe card and a probe module thereof are provided. The probe module includes a supporting board, a substrate disposed on the supporting board, a plurality of cantilever probes, and a plurality of fine adjustment members. The substrate has a non-planar shape and has a difference of warpage along a testing direction. One end of each of the cantilever probes is connected to the substrate, and another end of each of the cantilever probes is a free end. The fine adjustment members are spaced apart from each other and are disposed between the supporting board and the substrate. Each of the fine adjustment members is configured to be independently operable along the testing direction for changing a distance between the supporting board and the substrate. The substrate is deformable through at least one of the fine adjustment members so as to reduce the difference of warpage.

Cantilever probe card and probe module thereof

A vertical probe card having different probes is provided, and includes a first guiding board unit, a second guiding board unit, and a plurality of fence-like probes passing through the first and the second guiding board units. Each of the fence-like probes has a probe length within a range from 5 mm to 8 mm, and includes a fence-like segment, a connection segment, and a testing segment. The fence-like segment includes a penetrating slot having a length greater than 65% of the probe length. The fence-like segment includes two arms respectively arranged at two opposite sides of the penetrating slot and spaced apart from each other by an adjustment distance within a range from 10 μm to 120 μm. The fence-like probes include a first probe and a second probe, which have a same contact force and are configured to respectively meet different electrical transmission requirements.

Vertical probe card having different probes

A modular vertical probe card having different probes is provided, and includes a first guiding board unit, a second guiding board unit, and a plurality of conductive probes that pass through the first and the second guiding board units. The conductive probes have a same probe length. Each of the conductive probes includes a stroke segment located between the first guiding board unit and the second guiding board unit, a connection segment, and a testing segment, the latter two of which are respectively connected to two ends of the stroke segment. The stroke segments of the conductive probes have N number of shapes different from each other to allow the conductive probes to have a same contact force and to be configured to meet N number of electrical transmission requirements different from each other, in which N is a positive integer greater than one.

Modular vertical probe card

A cantilever probe card device and an elastic probe thereof are provided. The elastic probe includes a soldering segment, a testing segment, two outer elastic arms spaced apart from each other. The testing segment is spaced apart from the soldering segment along an arrangement direction, and has a needle tip, an outer edge, and an inner edge that is opposite to the outer edge. Each of the two outer elastic arms has two end portions respectively connected to the soldering segment and the inner edge of the testing segment. Moreover, one of the two outer elastic arms adjacent to the needle tip is defined as a first outer elastic arm, and another one of the two outer elastic arms is defined as a second outer elastic arm. Specifically, a length of the first outer elastic arm is greater than a length of the second outer elastic arm.

Cantilever probe card device and elastic probe thereof

A vertical probe card and a fence-like probe thereof are provided. The fence-like probe has a probe length within a range from 5 mm to 8 mm. The fence-like probe includes a fence-like segment, a ceramic layer, a connection segment, and a testing segment. The fence-like segment has an elongated shape defining a longitudinal direction, and the fence-like segment has a penetrating slot that is formed along the longitudinal direction and that has a length greater than 65% of the probe length. The ceramic layer is directly formed on an outer surface of the fence-like segment and covers two long walls of the penetrating slot. The connection segment and the testing segment are respectively connected to two end portions of the fence-like segment, and is not formed on the connection segment and the testing segment.

Vertical probe card and fence-like probe thereof

A cantilever probe card device and a focusing probe thereof are provided. The focusing probe includes a soldering segment, a testing segment, two outer elastic arms spaced apart from each other, and a focusing portion. The testing segment is spaced apart from the soldering segment along an arrangement direction, and has a needle tip, an outer edge, and an inner edge that is opposite to the outer edge. Each of the two outer elastic arms has two end portions respectively connected to the soldering segment and the inner edge of the testing segment. The focusing portion is connected to the inner edge and is located between the needle tip and the two outer elastic arms, and has a plurality of focusing points arranged on one side thereof away from the two outer elastic arms.

Cantilever probe card device and focusing probe thereof

A cantilever probe card and a carrier thereof are provided. The carrier includes a seat, a metal sheet, and a plurality of coarse adjustment members. The metal sheet is assembled to the seat and has a carrying surface. The coarse adjustment members are spaced apart from each other and are disposed between the seat and the metal sheet. Each of the coarse adjustment members is configured to be independently operable along a testing direction for changing a distance between the carrying surface and the seat. The carrying surface has a plurality of assembling regions spaced apart from each other, and at least two of the assembling regions have an assembling tolerance therebetween along the testing direction. The metal sheet of the carrier is deformable through at least one of the coarse adjustment members so as to reduce the assembling tolerance along the testing direction.

Cantilever probe card and carrier thereof

A probe card device and a disposable adjustment film thereof are provided. The disposable adjustment film is integrally formed as a single one-piece structure, and includes a probe hole and a plurality of first slots that are parallel to each other. The disposable adjustment film defines two predetermined lines respectively extending from two opposite lateral edges thereof to the probe hole. The two predetermined lines respectively extend across the first slots. In a plane that the disposable adjustment film is located thereon, when the disposable adjustment film is applied with forces that act in opposite directions and that are parallel to any one of the first slots, the disposable adjustment film is broken into two abandoned films along the two predetermined lines.

Probe card device and disposable adjustment film thereof

The present disclosure provides a probe card device and a conductive probe thereof. The conductive probe includes a metallic pin, an outer electrode, and a dielectric layer. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, and a first contacting segment and a second contacting segment respectively extending from the first connecting segment and second contacting segment along two opposite directions away from the middle segment. At least part of the outer electrode corresponds in position to the middle segment and is arranged adjacent to the first connecting segment. The dielectric layer is sandwiched between and entirely separates the metallic pin and the outer electrode, so that the outer electrode, the dielectric layer, and the metallic pin are jointly configured to generate a capacitance effect.

Probe card device

A probe card device includes an upper die unit, a lower die unit, a spacer sandwiched between the upper and lower die units, an impedance adjusting member, and conductive probes. The upper die unit includes a first die and a second die spaced apart from the first die. The first die has a penetrating hole, and the second die has a circuit layer. The impedance adjusting member is disposed on the second die and is electrically coupled to the circuit layer. Each of the conductive probes passes through the upper die unit, the spacer, and the lower die unit. At least one of the conductive probes includes an upper contacting segment protruding from the upper die unit and an extending arm connected to the upper contacting segment. The extending arm is abutted against the circuit layer by passing through the penetrating hole.

Probe card device and matching probe thereof

A probe carrier of a probe card device includes an upper die unit, a lower die unit, a spacer sandwiched between the upper and lower die units, and an impedance adjusting member. The upper die unit includes a first die, a second die spaced apart from the first die, and a flexible board disposed on the second die and arranged away from the first die. The flexible board includes a plurality of penetrating holes and a circuit layer. The impedance adjusting member is disposed on the flexible board and is electrically coupled to the circuit layer. The circuit layer includes at least one plated wall arranged in at least one of the penetrating holes, a part of the flexible board having the at least one plated wall is separable from the second die by receiving an internal force.

Growing community of inventors

Taipei, Taiwan

Chao-Hui Tseng