Faraday Technology Corporation

Pixart Imaging Incorporated

Taiwan Space Agency

Pixart Imaging Incorporation

Pixart Imaging Incorporation, R.o.c.

Chao-Chi Lee

Wen-Cheng Yen

Ren-Chieh Liu

Chih-Fu Chien

En-Feng Hsu

Yi-Yuan Chen

Yu-Tong Lin

Cheng-Chung Chou

Han-Chi Liu

Ching-Wei Chen

En-feng Hsu

Chuan-Hsin Lee

Chia-Hsun Wu

Pai-Heng Hsiao

The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor further records defect pixels of a pixel array such that in integrating pixel data to integrators, the pixel data associated with the defect pixels is not integrated into corresponding integrators.

Time delay integration sensor handling defect pixels

The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes two pixel arrays each having multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by a time ratio of the line time difference and the frame period. The TDI sensor doubles a number of times of integrating pixel data corresponding to the same position of a scene by arranging two separately operated pixel arrays.

Time delay integration sensor with multiple sensor arrays

The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by a time ratio of the line time difference and the frame period. The line time difference of the TDI sensor is changeable without changing the separation space.

Time delay integration sensor

A surge current compensating circuit has a compensating current generation unit, a bias unit, and a switch unit, for compensating a surge current drawn from a supply power after an output signal of a specific circuit transits. The compensating current generation unit is electrically coupled to the output stage of the specific circuit. The bias unit is electrically coupled to the compensating current generation unit through the switch unit. Before the output signal transits, the switch unit is disabled and the compensating current generation unit is enabled, so as to draw the compensating current from the supply power. After the output signal transits, the switch unit is enabled and the compensating current generation unit is disabled, such that the compensating current is not drawn from the supply power.

Surge current compensating circuit and comparator module

The present invention discloses a sensor device with dark current compensation and control method thereof. The sensor device includes: a sensor circuit, for sensing a physical property or a chemical property to generate an analog sensing signal; a dark current compensation circuit, which is coupled to the sensor circuit, for processing the analog sensing signal and generating an analog compensated signal according to a reference signal; and a convertor circuit, which is coupled to the dark current compensation circuit, for generating a digital sensing signal according to the analog compensated signal.

Sensor device with dark current compensation and control method thereof

The present invention discloses a high dynamic range imager circuit and a method for reading high dynamic range image with an adaptive conversion gain. The high dynamic range image circuit includes a variable capacitor. The capacitance of the variable capacitor is adjusted according to sensed light intensity or by internal feedback control, to adaptively adjust the conversion gain of the high dynamic range image circuit as it reads a signal which relates to a pixel image sensed by an image sensor device. In each cycle, the signal can be read twice or more with different dynamic ranges, to enhance the accuracy of the signal.

High dynamic range imager circuit and method for reading high dynamic range image

A capacitor structure is provided. The capacitor structure is configured in a substrate. The capacitor structure includes a plurality of electrode sets, at least a first conductive plug and at least a second conductive plug. The electrode sets correspond with each other and are disposed in different layers of the substrate. Each electrode set comprises a first electrode and a second electrode surrounding the former. In addition, the first conductive plug and the second conductive plug are disposed between two adjacent electrode sets. First electrodes of two adjacent electrode sets correspond with each other and are electrically connected to each other through the first conductive plug. Similarly, second electrodes of two adjacent electrode sets correspond with each other and are electrically connected to each other through the second conductive plug.

Capacitor structure

A capacitor structure is provided. The capacitor structure is configured in a substrate. The capacitor structure includes a plurality of electrode sets, at least a first conductive plug and at least a second conductive plug. The electrode sets correspond with each other and are disposed in different layers of the substrate. Each electrode set includes a first electrode and a second electrode surrounding the former. In addition, the first conductive plug and the second conductive plug are disposed between two adjacent electrode sets. First electrodes of two adjacent electrode sets correspond with each other and are electrically connected to each other through the first conductive plug. Similarly, second electrodes of two adjacent electrode sets correspond with each other and are electrically connected to each other through the second conductive plug.

A bandgap reference circuit. In the bandgap reference circuit, a current generator includes a first bipolar junction transistor (BJT) and generates a first positive temperature coefficient current thereby producing a negative temperature coefficient voltage between a base terminal and an emitter terminal of the first bipolar junction transistor. A single-end gain amplifier includes a positive input terminal coupled to the emitter terminal of first the bipolar junction transistor. A first resistor is coupled between the output terminal of the single-end gain amplifier and an output terminal of the bandgap reference circuit to generate a first current. A current-to-voltage converter is coupled to the first resistor to convert the first positive temperature coefficient current and the first current to a bandgap voltage.

Bandgap reference circuits

A voltage detection circuit for detecting the voltage level of a first power source. A first transistor includes a first gate, a first source, and a first drain coupled to the first gate. A second transistor includes a second gate, a second source, and a second drain coupled to the second gate. A comparator includes a first input terminal, a second input terminal coupled to the second drain, and an output terminal. A first resistor is coupled between the first input terminal and the first drain. A second resistor is coupled to the first power source. A third resistor is coupled between the second resistor and the first input terminal. A fourth resistor is coupled between the second resistor and input terminal. A fifth resistor is coupled between the first source, and a second power source. A resistive device is coupled between the first source, and the first power source.

Voltage detection circuit

A voltage detection circuit. A second NMOS transistor has a gate coupled to the gate of a first NMOS transistor. A comparator has input terminals, and an output terminal. A first resistor is coupled between the first input terminal and the source of the first NMOS transistor, a second resistor is coupled to the comparator and the first resistor, a third resistor is coupled between the second resistor and the comparator, and a fourth resistor is coupled between the second and third resistors, and ground. A first PMOS transistor has a gate coupled to the gates of the first and second NMOS transistors. A second PMOS transistor has a connected gate and drain, a source coupled to the gates of first and second NMOS transistors, a drain coupled to ground, and an n-well directly connected to the gates of the first and second NMOS transistors.

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Taipei, Taiwan

Chao-Chi Lee