General Electric Company

Changting Wang

Yuri Alexeyevich Plotnikov

Ui Won Suh

William Stewart McKnight

Aparna Chakrapani Sheila-Vadde

Haiyan Sun

Waseem Ibrahim Faidi

Nilesh Tralshawala

Shridhar Champaknath Nath

Mandar Diwakar Godbole

Ertugrul Berkcan

Emad Andarawis Andarawis

Daniel White Sexton

Austars Raymond Schnore, Jr

Marc Robert Pearlman

Andrzej Michal May

Gigi Olive Gambrell

Nicholas Joseph Kray

William James Premerlani

Kenneth Brakeley Welles

Andrew Paul May

Andrew A May

Scott Charles Evans

Thomas James Batzinger

Francis Howard Little

Jamie Thomas Livingston

Shu Ching Quek

Samantha Rao

Charles Scott Sealing

Yanyan Wu

Ralph Gerald Isaacs

Peter James Fritz

Terry Michael Topka

Ramakrishna Rao

Stephane Renou

Stephen Eric Zingelewicz

Sandeep Kumar Dewangan

Howard Daniel Driver

Eugene Joseph Orlowski, Jr

Steven Haines Olson

David M Dombrowski

Mingxiao Jiang

Somashekhar Basavaraj

Shyamsunder Tondanur Mandayam

Preeti Pisupati

Yury Alexeyevich Plotnikov

Rahul Gore

Walter Joseph Bantz

Wendai Wang

David Paul Lappas

Mottito Togo

Serkan Ertekin

Peyush Kumar Mishra

William Stewart Mcknight

Shridhar Nath

William Stewart Mcnight

Peter J Fritz

Jr Austars Raymond Schnore

Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.

Magnetic inspection systems for inspection of target objects

Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.

Eddy current array probe

The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein.

Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probe

A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.

Eddy current inspection system and method

A method of non-destructive testing that employs composite systems that include a curable resin and detectable particles that have a property that can be distinguished from a property of the resin is disclosed. Array probes useful in the method also are disclosed.

Method for non-destructive testing of composite systems

An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.

System and method for eddy current inspection of parts with complex geometries

A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

Method and system for integrating eddy current inspection with a coordinate measuring device

An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.

System and method for inspection of parts with an eddy current probe

A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.

Flexible eddy current array probe and methods of assembling the same

Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.

Omnidirectional eddy current array probes and methods of use

A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.

Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same

A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.

Multi-frequency image processing for inspecting parts having complex geometric shapes

A non-planar part has a non-planar surface such as an edge, and may contain an anomaly such as a crack. The non-planar part is inspected using an eddy current technique. The method includes providing the non-planar part having the non-planar surface thereon, driving an eddy current probe at two or more frequencies, measuring an eddy current response signal of the non-planar part at each frequency, and performing a multifrequency phase analysis on the eddy current response signals.

Inspection of non-planar parts using multifrequency eddy current with phase analysis

A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.

Pulsed eddy current pipeline inspection system and method

A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.

Inspection method and system using multifrequency phase analysis

Growing community of inventors

Niskayuna, NY, United States of America

Changting Wang