Microsoft Technology Licensing, LLC

Changsin Lee

Aleksandar Uzelac

David Abzarian

Xiao Tu

David Alan Stevens

Michael Nelte

Takahiro Shigemitsu

Uros Batricevic

Silvano Bonacina

Andrey Borissov Batchvarov

Alan Stephenson

Scott S Sheehan

Alan W Stephenson

Robert K Mickle

Michael A Nelte

The techniques described herein are directed to receiving parameters directed to correcting spatial error and/or jitter associated with an interaction device connected to a computing device. In some instances, the parameters are encrypted parameters that may be decrypted and consumed to correct the spatial error and/or the jitter associated with the interaction device. For instance, the parameters may provide an adjustment to one or more reported positions of input received from a detection area of the interaction device, so that a display position more accurately reflects, based on the adjustment, an actual position of input on the detection area of the interaction device.

Interaction device corrective parameters

Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.

Latency measurement

APIs to test a device are described. In one or more implementations, a device includes a housing, one or more sensors supported by the housing, and one or more modules disposed within the housing that are implemented at least partially in hardware. The one or more modules are configured to process inputs detected using the one or more sensors and expose one or more application programming interfaces to a robot to cause the robot to perform one or more operations that are detectable by the one or more sensors, the one or more operations usable to test detection performed by the one or more sensors and the processing of the inputs performed by the one or more modules.

APIs to test a device

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Redmond, WA, United States of America

Changsin Lee