Samsung Display Co., Ltd.

Samsung Electronics Co., Ltd.

Industrial Cooperation Foundation Chonbuk National University

Changhyun Ryu

Suk Ho Choi

Seunghee Lee

Wal Jun Kim

Youngjin Noh

Sung-Mo Gu

Youngwon Kim

Young Eun Choi

JoongYoung Ryu

Chi Youn Chung

Seung-Young Baeck

Deok Joo Lim

An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.

Inspection device of display device and inspection method of display device

An inspection apparatus for detecting a defect of a substrate is provided. The inspection apparatus includes a liquid crystal modulator, a light emitting unit, a beam splitter, and a measurement unit. The liquid crystal modulator includes a reflection layer, a liquid crystal layer, an electrode, and a polarizer. The reflection layer reflects a light. The sensor layer includes a hybrid aligned nematic liquid crystal. The electrode is provided on the liquid crystal layer. The polarizer is provided on the electrode.

Liquid crystal modulator for detecting a defective substrate and inspection apparatus having the same

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Cheonan-si, South Korea

Changhyun Ryu