Samsung Electronics Co., Ltd.

Changgon Kim

Jeongwon Lee

Hongseok Yang

Jaecheol Bae

Eunho Kim

Sanghwan Jeong

An electronic device is provided. The electronic device includes a memory, an image sensor including light receiving elements each including at least two sub light receiving elements, and an image signal processor. The image signal processor is configured to obtain images corresponding to light from outside by using the image sensor, the images including at least a raw image, a first sub image, and a second sub image, the first sub image being an image corresponding to light detected by at least one first sub light, the second sub image being an image corresponding to light detected by at least one second sub light, identify a luminance ratio between the first sub image and the second sub image, identify a defect in the raw image, based on the luminance ratio, and perform a function corresponding to a type of the defect.

Electronic device for detecting defect in image on basis of difference among sub-images acquired by multiple photodiode sensors, and operation method thereof

Growing community of inventors

Suwon-si, South Korea

Changgon Kim