X-rite Gmbh

Changbo Huang

Jon Nisper

Thomas Richardson

Marc S Ellens

An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors. Furthermore, a method for using the calculated xDNA for rendering the surface color.

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Changbo Huang