Samsung Electronics Co., Ltd.

Chang-woo Noh

Dong-Il Bae

Myung-gil Kang

Jae-Hyeoung Ma

Geum-jong Bae

Ho-jun Kim

Shigenobu Maeda

Dong-won Kim

Keun-Hwi Cho

Han-su Oh

Sung-man Whang

Mun-Hyeon Kim

Mun-hyeon Kim

Dong-Îl Bae

A semiconductor device may include first channels on a first region of a substrate and spaced apart from each other in a vertical direction substantially perpendicular to an upper surface of the substrate, second channels on a second region of the substrate and spaced apart from each other in the vertical direction, a first gate structure on the first region of the substrate and covering at least a portion of a surface of each of the first channels, and a second gate structure on the second region of the substrate and covering at least a portion of a surface of each of the second channels. The second channels may be disposed at heights substantially the same as those of corresponding ones of the first channels, and a height of a lowermost one of the second channels may be greater than a height of a lowermost one of the first channels.

Semiconductor devices having different numbers of stacked channels in different regions

A semiconductor device according to an example embodiment includes a substrate extending in first and second directions intersecting with each other; nanowires on the substrate and spaced apart from each other in the second direction; gate electrodes extending in the first direction and spaced apart from each other in the second direction, and surrounding the nanowires to be superimposed vertically with the nanowires; external spacers on the substrate and covering sidewalls of the gate electrodes on the nanowires; and an isolation layer between the gate electrodes and extending in the first direction, wherein an upper surface of the isolation layer is flush with upper surfaces of the gate electrodes.

Semiconductor devices

Semiconductor devices having different numbers of stacked channels in different regions and methods of manufacturing the same

An integrated circuit device includes a base burying insulating film covering a lower side wall of a fin-type active region on a substrate, an isolation pattern having a top surface higher than a top surface of the base burying insulating film, and a gate line covering a channel section of the fin-type active region. The gate line has an upper gate covering an upper portion of the channel section and a lower gate protruding from the upper gate toward the substrate and filling a space between a lower side wall of the channel section and an upper side wall of the isolation pattern.

Integrated circuit device

Disclosed are CMOS device and CMOS inverter. The CMOS device includes a substrate having active lines extending in a first direction and defined by a device isolation layer, the substrate being divided into an NMOS area, a PMOS area and a boundary area interposed between the NMOS and the PMOS areas and having the device isolation layer without the active line, a gate line extending in a second direction across the active lines and having a first gate structure on the active line in the first area, a second gate structure on the active line in the second and a third gate structure on the device isolation layer in the third area. The electrical resistance and parasitic capacitance of the third gate structure are smaller than those of the NMOS and the PMOS gate structures. Accordingly, better AC and DC performance of the CMOS device can be obtained.

Semiconductor devices and inverter having the same

Growing community of inventors

Hwaseong-si, South Korea

Chang-woo Noh