Shanjin Optoelectronics (suzhou) Co., Ltd.

Chang Seok Park

Hang Suk Choi

Ho Jin Kim

Myoung Gon Yang

Je Hyun Kim

The present disclosure relates to a system and a method of detecting a defect of an optical film, and more particularly, to a system and a method of detecting a defect of an optical film, which obtain an image of a defect of an optical film projected onto a screen and detect the defect of the optical film. As an exemplary embodiment of the present disclosure, a system for detecting a defect of an optical film may be provided. The system for detecting a defect of an optical film may include: a lighting unit, which is spaced apart from the optical film, and irradiates light toward one surface of the optical film; a screen, which is spaced apart from the other surface of the optical film, and on which a defect existing in the optical film is projected and displayed according to the pass of the light irradiated from the lighting unit through the optical film; an imaging unit, which is spaced apart from the screen, and obtains an image of the defect of the optical film projected onto the screen; and an analyzing unit, which analyzes the obtained image, and detects the defect of the optical film based on a result of the analysis.

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Daejeon, South Korea

Chang Seok Park