Lx Semicon Co., Ltd.

Samsung Electronics Co., Ltd.

Chang Gi Min

Young Tae Kim

Jin Woo Lee

Dong Hun Lee

Young Bok Kim

Taiming Piao

Seok Heo

Yong Won Choi

Yi Jin

Won Youn Kim

Jae Won Jeong

Seung Oh Ko

Yun Jong Choi

The present disclosure discloses a display driving apparatus. The display driving apparatus of the present disclosure may be configured to drive a source signal in a state optimized for a panel load of a display panel.

Display driving apparatus

A display driver including a crack resistance measurement circuit according to one embodiment of the present disclosure includes a crack resistance measurement circuit connected to a crack resistance circuit of a display panel to measure a crack resistance of the crack resistance circuit, wherein the crack resistance measurement circuit includes a reference resistance generation circuit configured to generate a reference resistance using at least two resistors connected in series and at least two switches connected to correspond to the at least two resistors, a comparator configured to compare a magnitude of the crack resistance with a magnitude of the reference resistance and output a resistance comparison result, and a circuit controller configured to output a reference resistance control signal for controlling the at least two switches according to the resistance comparison result.

Display driver including crack resistance measurement circuit and method of measuring crack of display panel

A method for controlling a semiconductor manufacturing facility includes measuring output change amounts of differential pressure sensors in the facility when pressure conditions change by a number of fans. The fans are then classified into different groups and subgroups and control sequences of the subgroups are determined based on the change amounts. Difference values are then calculated, and a control signal is generated to adjust the rotation speed of the fans.

System and method for controlling semiconductor manufacturing facility, method of manufacturing integrated circuit using the system and method, and method of manufacturing processor using the system and method

Growing community of inventors

Daejeon, South Korea

Chang Gi Min