Stmicroelectronics International N.v.

Stmicroelectronics Pvt. Ltd.

St-ericsson Sa

Chandrajit Debnath

Pratap Narayan Singh

Ashish Kumar

Rakesh Malik

Adeel Ahmad

Ankur Bal

Neha Bhargava

Mohit Kaushik

Rajeev Jain

Vigyan Jain

Anubhuti Rangbulla

Arnold James D'Souza

Ashish Kumar Sharma

An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.

Circuit and method for generating reference signals for hybrid analog-to-digital convertors

A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.

Ultra low temperature drift bandgap reference with single point calibration technique

A built-in self-test (BIST) circuit is provided for testing an analog-to-digital converter (ADC). A multi-order sigma-delta (&#x3a3;&#x394;) modulator has an input that receives an input signal, a first output generating analog test signal derived from the input signal and applied to an input of the ADC and a second output generating a binary data stream. A digital recombination and filtering circuit has a first input that receives the binary data stream and a second input that receives a digital test signal output from the ADC in response to the analog test signal. The digital recombination and filtering circuit combines and filters the binary data stream and digital test signal to generate a digital result signal including a signal component derived from an error introduced by operation of the ADC. A correlation circuit is used to isolate that error signal component.

Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit

An embodiment ADC device includes a plurality of comparator elements, each comparator element of the plurality of comparator elements having a first input connected to an input port, each comparator element of the plurality of comparator elements having a second input port connected to a reference signal port. The ADC device further has a switch matrix having routing circuitry connected to an output of each comparator of the plurality of comparators, and a plurality of latches, with each latch of the plurality of latches having an input connected to the routing circuitry. The routing circuitry is configured to connect the output of each comparator of the plurality of comparators to an input of each latch of the plurality of latches according to one or more signals received at one or more control ports.

Analog-to-digital converter with dynamic element matching

An asynchronous SAR ADC converts an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

Adaptive delay based asynchronous successive approximation analog-to-digital converter

An asynchronous SAR ADC to convert an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

An amplifier has a first pull-up path coupled between a voltage supply node and an output node, and a pull-down path coupled between the output node and a ground supply node. A second pull-up path is coupled between the voltage supply node and the output node. The second pull-up path is actuated by a feedback signal and biased by a biasing signal. An inverter circuit is operable to invert the signal at the amplifier output node to generate the feedback signal. A biasing circuit is configured to generate the biasing signal. The biasing circuit is configured to control a relative strength of the pull-down path to the second pull-up path, wherein the pull-down path is stronger than the second pull-up path in a manner that is consistently present over all PVT corners.

Level shifting circuit with adaptive feedback

In accordance with an embodiment, a method of performing a successive approximation analog-to-digital (A/D) conversion includes determining a voltage range of an analog input voltage in a single cycle using a multi-bit flash A/D converter, determining an initial D/A value for a successive approximation based on determining the voltage range, and successively approximating the analog input voltage. Successively approximating includes providing the initial D/A value to a D/A converter, comparing an output of the D/A converter with the analog input voltage, and determining a further D/A value based on the comparing.

System and method for a successive approximation analog to digital converter

A multiplying digital-to-analog converter suited to maintain impedance balancing during phases. In an embodiment, an input signal may be sampled onto nodes of impedance elements during an initial phase. In a second phase the impedance elements are directly coupled either to a non-inverting reference input or the inverting reference input of an amplifier depending on an output of a related flash ADC output. The determination as to which capacitor is to be coupled to inverting or non-inverting input nodes may be directly programmed into the MDAC using switches, such that a thermometric to binary converter is not required in an example embodiment. Thus, the number of impedance elements coupled to the non-inverting reference input or inverting reference input REFM remains constant in each cycle such that there is no need to settle the non-inverting reference input or inverting reference input to full accuracy.

Multiplying digital-to-analog converter configured to maintain impedance balancing

An analog input signal is sampled, and the sampled analog input signal is converted to a digital value. A calibration value is also sampled, and a single bit of an N bit offset value is calculated from the sampled calibration value. The sampling operations are alternatively performed so that one bit of the offset value is generated for each generated digital value. For example, the process is repeated N times to calculate all N bits of the offset value while generating N digital values.

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Greater Noida, India

Chandrajit Debnath