Aem Holdings Ltd.

Aem Singapore Pte. Ltd.

Chan See Jean

Samer Kabbani

Paul R Hoffman

Thomas P Jones

Disclosed herein are thermal heads and corresponding test systems for independently controlling a one or more components while testing one or more devices under test. In some embodiments, a thermal head comprises a plurality of adapters, one or more heaters, and one or more thermal controllers for independently controlling temperatures of the components. The thermal controllers may control the temperatures of at least some of the components independently such that thermal control of one component does not affect the thermal control of the other component. In some embodiments, the thermal control is by way of one or more cold plates, and the thermal head comprises one or more cold plates. Embodiments of the disclosure further include independent control of one or more forces using one or more force mechanisms.

Thermal head comprising a plurality of adapters for independent thermal control of zones

Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones

Thermal head for independent control of zones

Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones

Growing community of inventors

Singapore, Singapore

Chan See Jean