Samsung Electronics Co., Ltd.

Chan-Hyang Lim

Min-Young Won

In-Cheol Song

Won-hee Lee

Il-Ho Lee

Kun-Jong Lee

A display substrate includes a substrate, signal lines and test lines. The substrate includes a pixel region where pixels are disposed, a buffer region surrounding the pixel region and a grinding region surrounding the buffer region. The signal lines pass through the buffer region from the grinding region to provide the pixels with a driving signal. The test lines are disposed on the grinding region and the buffer region, respectively, so that the test lines intersect the signal lines in a lattice structure. Each of the test lines is electrically connected to the signal lines of a first number calculated by dividing a second number of the signal lines by a third number of the test lines. Thus, the performance of the pixels used for displaying an image may be tested more precisely.

Method of manufacturing a display substrate using a laser to remove test lines from the substrate without cutting the substrate

A visual inspection apparatus includes a plurality of cameras for photographing a display panel and a processor for processing the photographed image. Specifically, the visual inspection apparatus includes: a work table having a panel mounting unit on which a display panel is mounted; a camera module which is disposed in a direction normal to the panel mounting unit and which has a plurality of cameras arranged in a matrix; and a processor for processing the images of the display panel photographed with the cameras. The plurality of cameras is arranged in a matrix with variable distances between the cameras. Since the visual inspection apparatus includes the cameras arranged in a matrix, it can be used to effectively detect a variety of defects.

Growing community of inventors

Yongin-si, South Korea

Chan-Hyang Lim