Samsung Electronics Co., Ltd.

Chaehoon Kim

Sangwan Nam

Jiho Cho

Jihwan Kim

Yohan Lee

Jin-Young Chun

Junyoung Ko

Minjae Seo

Jiwon Seo

Hojun Lee

Jungho Song

Myeongwoo Lee

Sanggi Hong

Chanho Kim

Bongsoon Lim

Pansuk Kwak

Jaeduk Yu

Sangwon Park

Hongsoo Jeon

Taeyun Lee

Kyoman Kang

Yongha Park

Tae-hong Kwon

Jeunghwan Park

Yunyeong Jeon

Jungyun Yun

A nonvolatile memory device includes a memory cell array in a first semiconductor layer and including a first memory cell connected to a first word line and a first bit line and a second memory cell connected to the first word line and a second bit line; a page buffer circuit in a second semiconductor layer and including a first page buffer connected to the first bit line, and a second page buffer connected to the second bit line; and a page buffer controller in the second semiconductor layer. The page buffer controller controls the first and second page buffers so that a develop timing of a first sensing node of the first page buffer is different from a develop timing of a second sensing node of the second page buffer. The first page buffer is closer to a through electrode region than the second page buffer.

Nonvolatile memory device for increasing reliability of data detected through page buffer

In a method of operating a nonvolatile memory device that includes a memory block including cell strings where each of the cell strings includes a string selection transistor, memory cells and a ground selection transistor which are connected in series and disposed in a vertical direction, each of word-lines coupled to the memory cells is set up to a respective target level during a word-line set-up period, a sensing operation on target memory cells is performed by applying a read voltage to a selected word-line coupled to the target memory cells while applying a read pass voltage to unselected word-lines during a sensing period, and while consuming an internal voltage connected to the unselected word-lines in a particular circuit in the nonvolatile memory device, a voltage level of the unselected word-lines is recovered to a level of the internal voltage during a discharge period of a word-line recovery period.

Nonvolatile memory device preventing overshoot of internal voltage and method of operating nonvolatile memory device

A nonvolatile memory device includes a memory block and a control circuit. The memory block includes a plurality of cell strings where each of the plurality of cell strings includes a string selection transistor, a plurality of memory cells and a ground selection transistor which are connected in series and disposed in a vertical direction between a bit-line and a common source line. The control circuit adjusts a level of a high voltage applied to a gate of a pass transistor of a selected word-line such that a voltage difference between the high voltage and a program voltage applied to a drain of the pass transistor differs in at least a portion of a plurality of program loops based on a comparison of a number of the program loops and a reference number during a program operation on a target memory cells.

Nonvolatile memory device with configuration to apply adjustable voltage to pass transistor gate

A semiconductor device includes a CSL driver on a substrate, a CSP on the CSL driver, a gate electrode structure on the CSP and including gate electrodes spaced apart from each other in a first direction perpendicular to an upper surface of the substrate, each of the gate electrodes extends in a second direction parallel to the upper surface of the substrate, a memory channel structure on the CSP and extending through the gate electrode structure and is connected to the CSP, a first upper wiring structure contacting an upper surface of the CSP, a first through via extending through the CSP in the first direction and is electrically connected to the first upper wiring structure and the CSL driver but does not contact the CPS, and a dummy wiring structure contacting the upper surface of the CSP but is not electrically connected to the CSL driver.

Semiconductor device and massive data storage system including the same

A method of operating a nonvolatile memory device which includes at least one memory block is provided. The method includes providing a plurality of word-lines with a voltage during a word-line set-up period, precharging a plurality of driving lines with a voltage during a word-line development period, detecting a voltage drop of a sensing node during a sensing period, and detecting leakage based on the voltage drop.

Nonvolatile memory device and method of operating a nonvolatile memory

A method controls a memory device that includes a page buffer circuit comprising a plurality of page buffers each comprising at least one latch. The method includes generating by an internal voltage circuit at least one internal voltage among internal voltages used for an operation of the page buffer circuit, the internal voltage circuit providing the at least one internal voltage to the page buffer circuit; and providing to the page buffer circuit a control signal for forming an electrical connection between the internal voltage circuit and a first electrical node of a first page buffer unused for buffering in the page buffer circuit during a set operation for a first latch of a second page buffer.

Memory device for stabilizing internal voltage and method of stabilizing internal voltage of the same

At least one latch of a page buffer of a nonvolatile memory device includes a capacitor that selectively stores a voltage of a sensing node. The capacitor includes at least one first contact having a second height corresponding to a first height of each of cell strings, and at least one second contact to which a ground voltage is supplied. The at least one second contact has a third height corresponding to the first height, disposed adjacent to the at least one first contact, and electrically separated from the at least one first contact.

Semiconductor memory device including a capacitor

A page buffer includes a pre-charge unit for pre-charging a bit line of a selected memory cell of a memory cell array via a first pre-charge line and pre-charging a sensing node via a second pre-charge line, during a pre-charge time, a bit line connection unit connected between the bit line and the sensing node and including a connecting node connected to the first pre-charge line, the bit line connection unit controlling a voltage of the sensing node, during a develop time, based on a bit line connection control signal and a sensing node voltage control signal, and a data input and output unit for generating sensing data by sensing a level of the voltage of the sensing node, during a sensing time.

Page buffer, a memory device including the same and a read operation method thereof

Methods of operating a memory device include at least partially charging a sensing node within a page buffer of the memory device to a first precharge voltage, by sampling a trip voltage of a sensing latch within the page buffer. Thereafter, a voltage of the sensing node is boosted from the first precharge voltage to a higher second precharge voltage. Then, a voltage of the sensing node that reflects a value of data stored in a memory cell of the memory device is developed at the sensing node. The developed voltage is then transferred to the sensing latch so that data stored by the sensing latch reflects the value of data stored in the memory cell.

Memory devices that sample latch trip voltages prior to reading data into latches and methods of operating same

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Suwon-si, South Korea

Chaehoon Kim