Samsung Electronics Co., Ltd.

Pusan National University

Industry-university Cooperation Foundation Sogang University

Chae-hun Lee

Young Shin Kim

Jae-chul Park

Dae-kun Yoon

Chang-jung Kim

Yong-Woo Jeon

Jae-Chul Park

Kyung-hoon Kim

Ho Kyung Kim

Jin-wook Burm

Jin-myoung Kim

Kang-ho Lee

Jun-an Lee

Provided are photon counting apparatuses and methods, and radiographic imaging apparatuses configured to receive charge signals corresponding to incident radiation photons, and to count the incident radiation photons by using a plurality of counting bits, such that the counting changes only one counting bit from among the plurality of counting bits when the count value is increased by one. By using the photon counting methods, a data-change frequency of photon counting data corresponding to radiation photons is minimized while counting the radiation photons based on charge signals corresponding to input radiation photons.

Photon counting apparatus and method, and radiographic imaging apparatus comprising the same

An apparatus for generating an image may include a plurality of scintillator layers configured to convert an incident beam into an optical signal; a plurality of micro cells configured to turn on or off depending on whether or not the micro cells detect the optical signal; a reaction depth determining unit configured to detect a decay pattern of the optical signal, on the basis of on/off signals of the micro cells, and configured to determine a type of the scintillator layers with which the incident beam has reacted; and/or a reading unit configured to decide an occurrence location of the incident beam and then generates a photographed image.

Apparatuses for and methods of generating images

A driver circuit outputs a result of classifying and counting photons based on one or more energy levels to a column line. The driver circuit includes a multiplexer for receiving the result from a counter, a driving inverter for receiving a signal from the multiplexer and a power supply, and a switch connected between the power supply and an input terminal of the driving inverter.

Driver circuit for outputting photon counting including a multiplexer, inverter and power supply

A photomultiplier detector cell for tomography includes a detector unit and a readOUT unit. The detector unit is configured to generate a digitized detect signal in response to receives light having a certain range of wavelength. The readOUT unit is configured to generate an output signal corresponding to the detect signal generated by the detector unit and to transmit the output signal to an external circuit. The readOUT unit is configured to transmit the output signal to the external circuit right after the detect signal is received.

Digital photomultiplier detector cell

A silicon photomultiplier detector cell may include a photodiode region and a readout circuit region formed on a same substrate. The photodiode region may include a first semiconductor layer exposed on a surface of the silicon photomultiplier detector cell and doped with first type impurities; a second semiconductor layer doped with second type impurities; and/or a first epitaxial layer between the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may contact the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may be doped with the first type impurities at a concentration lower than a concentration of the first type impurities of the first semiconductor layer.

Digital silicon photomultiplier detector cells

A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.

Growing community of inventors

Suwon-si, South Korea

Chae-hun Lee