International Business Machines Corporation

Qualcomm Incorporated

Chad Everett Winemiller

Robert Brian Likovich, Jr

Robert Glen Gerowitz

Russell Deans

Joseph David Mendenhall

Jon Boyette

Michael Patrick Muhlada

Darryl Jonathan Rumph

Charles Lenier Alley

John Christopher Morris

Fabrice Jean Verplanken

Jean Louis Calvignac

Michael Steven Siegel

Marco C Heddes

Brian Mitchell Bass

Zhi Zhu

Anthony Matteo Gallo

Robert J Reese

Kenneth Arcudia

Chia Heng Chang

Behnam Amelifard

David Otero

Mark Wesley Vilas

Kevin Wayne Spears

Robert Franklin Clark

Howard James Schubert, Jr

William Arthur Noon

Dror Barash

Jeffrey Paul Boettler

Carisa Anne Cassani

Robert B Likovich

Russell Coleman Deans

Jon Raymond Boyette

Power saving systems and methods for Universal Serial Bus (USB) systems are disclosed. When a USB physical layer (PHY) enters a U3 low power state, not only are normal elements powered down, but also circuitry within the USB PHY associated with detection of a low frequency periodic signal (LFPS) wake up signal is powered down. A low speed reference clock signal is still received by the USB PHY, and a medium speed clock within the USB PHY is activated once per period of the low speed reference clock signal. The medium speed clock activates the signal detection circuitry and samples a line for the LFPS. If no LFPS is detected, the signal detection circuitry and the medium speed clock return to low power until the next period of the low speed reference clock signal. If the LFPS is detected, the USB PHY returns to a U0 active power state.

Power saving systems and methods for Universal Serial Bus (USB) systems

Aspects disclosed in the detailed description include high-frequency signal observations in electronic systems. In this regard, a high-frequency signal observation circuit is provided in an electronic system to enable high-frequency signal observations. In one aspect, the high-frequency signal observation circuit comprises an observation signal selection circuit. The observation signal selection circuit is programmably controlled to select an observation signal among a plurality of electronic input signals (e.g., control signals) received from the electronic system. In another aspect, the high-frequency signal observation circuit is configured to utilize a bypass data path, which is routed around serializer/deserializer (SerDes) logic in the electronic system, to output the observation signal for observation. By programmably selecting the observation signal and outputting the observation signal via the bypass data path, it is possible to examine accurately any high-frequency signal (e.g., high-frequency clock signal) in the electronic system with minimized delay and/or degradation in the high-frequency signal.

High-frequency signal observations in electronic systems

Methods and systems for shared control of a phase locked loop (PLL) for a multi-port physical layer (PHY) are disclosed. In one aspect, an arbitration logic circuit is coupled to ports of a multi-port PHY sharing a phase locked loop (PLL). Upon receiving an indication that the shared PLL is to be reset, the arbitration logic circuit commands the ports sharing the PLL to enter a state in which any reset of the shared PLL would have minimal or no effect in their operations. In this manner, an integrated circuit (IC) including a multi-port PHY may be configured with only one PLL and associated clock generating logic to provide a clock signal for some or all of its ports, thus reducing its semiconductor area and power consumption. Furthermore, the ports of the multi-port PHY may operate independently from each other obviating any configuration and/or interoperability problems associated with having a shared PLL.

Shared control of a phase locked loop (PLL) for a multi-port physical layer (PHY)

Aspects disclosed in the detailed description include apparatuses, methods, and systems for glitch-free clock switching. In this regard, in one aspect, an electronic circuit is switched from a lower-frequency reference clock to a higher-frequency reference clock. An oscillation detection logic is configured to determine the stability of the higher-frequency reference clock prior to switching the electronic circuit to the higher-frequency reference clock. The oscillation detection logic derives a sampled clock signal from the higher-frequency reference clock, wherein the sampled clock signal has a slower frequency than the lower-frequency reference clock. The oscillation detection logic then compares the sampled clock signal against the lower-frequency reference clock to determine the stability of the higher-frequency reference clock. By deterministically detecting stability of a reference clock prior to switching to the reference clock, it is possible to avoid premature switching to an unstable reference clock, thus providing glitch-free clock switching in the electronic circuit.

Apparatuses, methods, and systems for glitch-free clock switching

Illustrative embodiments provide a computer-implemented method for resolving indeterminate states by inserting logic into a design. The computer-implemented method receives an original design input from a requester to form a received input and determines whether the received input contains an indeterminate output. Responsive to a determination that the received input contains an indeterminate output, the computer-implemented method generates a temporary design from the received input, wherein the temporary design contains 'unique' output and all inputs, updates the temporary design, and synthesizes the original design and each temporary design individually to form a synthesized original design and a set of synthesized temporary designs. The computer-implemented method merges the synthesized original design with the set of synthesized temporary design to form a final design; and returns the final design to the requester.

Indeterminate state logic insertion

The invention is directed to validating a specified manufacturing test rule, which pertains to an electronic component. The method includes generating a file of test data sets, wherein each test data set in the file is valid for the rule. Each test data set includes a stimulus comprising one or more single input vectors, and further includes a set of results that are expected. The method further comprises constructing a testbench to prepare testcases for simulation, wherein each testcase corresponds to the stimulus and the expected output results of one of the test data sets, and each testcase is disposed to be simulated separately, or independently, from every other testcase. The method further comprises selectively preparing each of the testcases for simulation, in order to provide simulated results for the stimulus corresponding to each testcase. The expected results and the simulated results are compared for each testcase.

Validating manufacturing test rules pertaining to an electronic component

A system for creating manufacturing test rules. Stimuli for an electronic design are generated automatically by a stimuli generator. The stimuli generator takes into account certain limitations of the design when automatically generating the manufacturing test rules. The design is tested by a testbench using the stimuli. A simulation log for the design is generated by the testbench. The simulation log is then processed by a simulation log processor. An HDL representation of the design is generated by the simulation log processor using the processed simulation log. A gate-level version of the design is generated by a synthesis tool using the HDL representation of the design. The gate-level version of the design is further processed by the synthesis tool to make any necessary modifications. Then, the gate-level version of the design is outputted as the final manufacturing test rule. Thus, creating manufacturing test rules can be completely automated.

Automatically creating manufacturing test rules pertaining to an electronic component

Systems for using relative positioning of items or components in a structure with dynamic ranges, such as an elastic I/O bus design for an Integrated Circuit (IC), are disclosed. Embodiments may include a user-defined type module having user-defined types representing relative instance positions within a structure. Embodiments may also include a translation helper module to receive information associated with a hierarchy and to return location information associated with the hierarchy and a translation module to translate between a specific location and a relative position of the instance based on one or more user-defined types and location information returned from the translation helper module to generate a list of translated results. Further embodiments of the translation module may include a relative position determiner to translate specific locations to relative positions and may also include a specific location determiner to translate relative positions to specific locations.

Systems for using relative positioning in structures with dynamic ranges

Methods and readable media for using relative positioning of items or components in a structure with dynamic ranges, such as an elastic I/O bus design for an Integrated Circuit (IC), are disclosed. Embodiments may include a user-defined type module having user-defined types representing relative instance positions within a structure. Embodiments may also include a translation helper module to receive information associated with a hierarchy and to return location information associated with the hierarchy and a translation module to translate between a specific location and a relative position of the instance based on one or more user-defined types and location information returned from the translation helper module to generate a list of translated results. Further embodiments of the translation module may include a relative position determiner to translate specific locations to relative positions and may also include a specific location determiner to translate relative positions to specific locations.

Methods and readable media for using relative positioning in structures with dynamic ranges

Methods, systems, and media for functional simulation of an I/O bus are disclosed. More particularly, a method of simulating distortion and noise parameters of an I/O bus is disclosed. Embodiments include constraining one or more fields of a record and determining delay amounts based on the resulting parameters, where the final delay amount includes a delay buffer and a net of delay amounts associated with the parameters. Embodiments may also include determining a value of a next bit to be sent to the I/O bus and, after waiting the delay amount, driving the bit on the bus to the next bit value. Parameters may include skew, jitter, duty cycle distortion, voltage reference distortion, and drift of any of these parameters. Further embodiments may include signaling the end of a phase in response to a phase done condition being satisfied.

Methods, systems and media for functional simulation of noise and distortion on an I/O bus

Methods, systems, and media for managing functional verification of a parameterizable design are disclosed. Embodiments include a system having a testbench configuration module adapted to configure a testbench, the testbench having testbench signals and one or more instantiated components having a plurality of ports of a generic design, where the testbench signals are wired to the plurality of ports. The testbench may also have one or more instantiated special components based on chip-specific versions of the design where the special components are wired to the same ports as the generic design. The system may also include a functional verification manager that, through a component module, observes values in the testbench and automatically configure a verification environment based on the observed values, including automatic insertion of checkers at different levels of hierarchy. The testbench may be a VHDL or Verilog testbench in some embodiments.

Methods, systems and media for managing functional verification of a parameterizable design

The present invention describes a system and method for independently verifying the Execution Rate of individual tasks by a device through simulation. Described is a situation in which a system has a main device through which data flows to and from other devices. Bus transfers must fall within required rates. A simulation of the configuration utilizes models of the various devices, including the &ldquo;Main device&rdquo;. This simulation is used to verify the data traffic and associated transfer rates. Data transfer includes random bursts, with randomly chosen periods between bursts. The data rate and data validity are measured during each burst period.

System and method to independently verify the execution rate of individual tasks by a device via simulation

A method of and program for dynamically testing a buffering and selection device, wherein the buffering and selection device receives a transmission at an average bandwidth of T and in peak bandwidth bursts that may be greater than T, are provided. The buffering and selection device transmits data to one or more receive devices, all of which have a total average bandwidth of at least T. The buffering and selection device has buffers apportioned to each receive device in order to store data that is written in burst mode destined for that receive device. The method includes disabling the output data flow to the receive device being tested and then generating input data to the buffering and selection device tagged for each receive device in burst mode at a preselected number of transfers for each receive device. The program determines when the preselected number of transfers has occurred and then enables data flow to the receive device being tested. It is then determined if output to each receive device has commenced within a preselected latency period, and, if it has, it is determined if the preselected number of transfers of data has occurred within a preselected transfer period, i.e., meets bandwidth requirements.

Verifying performance of a buffering and selection network device

A method and system for systematically accessing and monitoring operating parameter signals within an IC device. A probe configuration logic selects a subset of signals from among a set of available signals within a physical or logical subdivision of the IC device. Signal access logic selectively provides physical or logical access from the selected subset of signals within the physical or logical subdivision of the IC device to a probe sensor, such that IC device operations may be flexibly and comprehensively monitored. A local mode selector provides remote access to the selected subset of signals at an input/output (I/O) data interface. Data packaging logic in communication with the probe sensor permits port mirroring of the I/O data interface.

Network processor probing and port mirroring

Stuck-at fault, shorted and open circuit conditions occurring in the differential inputs to Differential Receivers on a Large Scale Integrated (LSI) chip are detected by a test circuit arrangement fabricated on the chip. The test circuit arrangement includes Pass Gate devices operatively coupled to the differential inputs and an Exclusive NOR circuit (XNOR) coupled to the Pass Gate devices. Pull devices are coupled to the Pass Gate devices and the differential inputs. By activating the Pass Gate devices and applying a test sequence to the differential inputs, the state of the output of the XNOR circuit indicates if an open circuit, stuck-at or short exists in the inputs to the Differential Receiver.

Growing community of inventors

Cary, NC, United States of America

Chad Everett Winemiller