Utsunomiya University

Cense J Abraham

Toyohiko Yatagai

An ellipsometry system and a detection unit thereof are capable of achieving miniaturization and price reduction associated therewith. The ellipsometry system includes the detection unit that: has an optical polarization element; separates an interference polarization beam obtained by causing the object-reflected polarization beam and reference reflected polarization beam to interfere with each other into a plurality of interference polarization beams on a wavelength basis; and detects the respective separated polarization components in each wavelength. The optical polarization element: has a birefringence characteristic including a first refractive index and a second refractive index; receives the separated interference polarization beams of the respective wavelengths in a wavelength order and in a parallel manner; separates the separated interference polarization beam of each wavelength, on a polarization component basis, while transmitting the same, and outputs the respective separated polarization components in each wavelength in the same direction but along different optical axes.

Ellipsometry system

An optical coherence eye-fundus tomography device has a high resolution and a good operability, as well as be miniaturized and be produced at a low cost. The optical coherence eye-fundus tomography device includes: a light source unit which emits a source light beam; a reference-light unit which reflects a reference light beam; an inspection unit which illuminates an object with an object scanning light beam, reflected the object scanning light beam; and a detection unit which obtains a tomographic image of the object on the basis of the interference light beam produced by interfering the reflected reference light beam with the reflected object light beam. For example, the light source unit emits the outgoing light beam that has a depth of focus of not less than 300 &#x3bc;m, and resolution that is 6 &#x3bc;m&#xd7;6 &#x3bc;m or higher in a planar direction perpendicular to a traveling direction of the outgoing light beam.

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Utsunomiya, Japan

Cense J Abraham