Abbott Laboratories Corporation

Catherine L Danial

Thomas L Barnes

James W Colburn

Sangvorn Rutnarak

Millard D Longman

William R Jones, Jr

A method of making a count probe for counting particles comprises the following steps. A count wafer is formed along with a core member having an opening for accepting the count wafer. The count wafer is applied to the opening in the core member to form an interference fit between the count wafer and the core member. After application of the count wafer to the opening in the core member, the core member is annealed to relieve stress in the core member.

Method of making stress relieved count probe

A method of making a count probe comprises the following steps. A member is made having a conduit and an opening. A wafer is made including an aperture. The wafer is removably inserted into the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.

Method of making count probe with removable count wafer

A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.

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Coconut Creek, FL, United States of America

Catherine L Danial