Ams Sensors Singapore Pte. Ltd.

Komax Holding Ag

Cassian Strässle

Miguel Bruno Vaello Paños

Bryant Hansen

Javier Miguel Sánchez

Liming Chen

Denis Faccenda

The present disclosure describes calibration methods for optoelectronic modules with active illumination, such as 3D ranging systems. Calibration methods include determining cross-talk calibration parameters for an optoelectronic module having an emitting channel and a receiving channel where the optoelectronic module is operable to demodulate modulated light incident on the receiving channel. Cross-talk calibration parameters are saved to a readable storage medium and recalled during distance measurements to an object or objects in a scene.

Optical crosstalk calibration for ranging systems

This disclosure is directed to methods for acquiring distance data using optical ranging systems. Optical ranging systems include one or more reference pixels and one or more object pixels. The methods employ operations for optimizing reference-pixel integration times and object-pixel integration times such that accurate distance data can be collected.

Acquisition of distance data with optical ranging systems

A distance acquisition method comprising: initializing an optical ranging system, the optical ranging system including a plurality of pixels operable to covert incident light to electrical charges; collecting electrical charges with the plurality of exposed pixels over an integration time, each pixel collecting electrical charges with an amplification and a sensitivity; correlating the electrical charges collected in each pixel to an exposure value for each pixel, the exposure value corresponding to being adequately exposed, over-exposed, or under-exposed; identifying each exposure value for each pixel as being either valid or invalid, wherein a valid exposure value corresponds to an adequately exposed pixel and an invalid exposure value corresponds to an over-exposed or under-exposed pixel; totalling the number of valid exposure value pixels; totalling the number invalid exposure value pixels; determining an exposure ratio, the ratio being the number of pixels with valid exposure values divided by the number of pixels with invalid exposure values; totalling the number of over-exposed pixels; totalling the number of under-exposed pixels; determining an invalid exposure ratio, the invalid exposure ratio being the number of over-exposed pixels divided by the number of under-exposed pixels; and determining an average valid exposure value, the average valid exposure value being the average of the valid exposure values. The method additionally comprises: using the exposure ratio, the invalid exposure ratio and the average valid exposure to optimise the integration time; using the exposure value for each pixel to optimise the amplification and sensitivity for each pixel; and determining distance data from electrical charges collected from at least one of the plurality of pixels.

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Wädenswil, Switzerland

Cassian Strässle