Nlight, Incorporated

Other

Trimble Inc.

Nlight Photonics Corporation

Electroglas, Inc.

Deep Photonics Corporation

Techne Systems, Inc.

Cary Steven Kiest

Joseph G LaChapelle

Scott R Karlsen

Jay Small

Vito P Errico

Mitch Stanek

Michael J Munroe

Aaron W Brown

David H Foster

Mitchell Ryan Reynolds

Richard C Krebs

Raymond Sohn

William F Lenzke, Jr

John R Goulding

A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.

Active monitoring of multi-laser systems

A system for providing locations for each of a plurality of non-Global Positioning System (GPS) enabled devices (e.g., locations of 'things' or objects in the IoT, for sensors in a WSN, and so on). The system includes a source device or 'thing' including memory (e.g., a long-range sensor in a WSN or the like). The system also includes a portable computing device (e.g., a handheld GPS-enabled device), and the portable computing device includes: (a) a processor; (b) a location-determining assembly operating to determine location information for the portable computing device; and (c) a location-transferring module run by the processor to provide the location information in the memory of the source device (e.g., to copy the information to a predefined storage location for later retrieval and inclusion in predefined parts of a message or data packet).

System for insertion of location data into a source device's storage location

A fiber monitoring system for detecting the occurrence of a thermal event, especially of a traumatic nature, in optical fibers while transmitting laser beams includes one or more fiber monitoring apparatuses each having a thermal sensing array supported by a holder board of a laminated dielectric material having a row of clips for retaining optical fibers in alignment with thermal sensor devices of the thermal sensing arrays. The thermal sensing arrays also have electrical circuitry elements for electrically interconnecting the thermal sensing devices in series and enabling electrically connecting the thermal sensing arrays with other circuitry to form a thermal interlock circuit for a laser system.

Fiber monitoring apparatus and system for detecting an optical fiber thermal event

A fiber laser with reduced stimulated Brillouin scattering includes a spool having a height and characterized by an induced temperature gradient with the height. The fiber laser also includes a fiber wrapped on the spool and characterized by a signal power increasing along the length of the fiber. The induced temperature gradient is a function of the signal power along the fiber.

Method and apparatus for increasing fiber laser output power

Plural light sources are provided for directing ring patterns of light toward at least one reflective bump formed on and projecting from a first wafer surface of a semiconductor wafer. The intensity of light from the light sources may be varied and may be varied independently of one another.

Method and apparatus for illuminating projecting features on the surface of a semiconductor wafer

A feature detection apparatus includes a reflective imaging system, a transmissive imaging system, and memory for generating an image of a workpiece. The reflective imaging system generates a first bit image of a surface of the workpiece. The transmissive imaging system generates a second, different bit image of the density of the workpiece. The two images are then combined in memory into a more complete image that contains data describing the surface and interior of the workpiece. The apparatus also includes a filter for enhancing the combined bit image so that physical features of the workpiece are accurately detected. The filter is constructed to perform the following steps. For detecting a feature of interest, the filter determines a mean, standard deviation, and normal distribution of the image's pixel intensities. The filter then uses the normal distribution to map the pixel intensities above the mean to one set of enhanced pixel intensities and to map pixel intensities below the mean to another set of enhanced pixel intensities. Pixels of the enhanced image are sampled to determine if a pixel meets a threshold intensity for the feature being sought. For a pixel that meets the threshold intensity, a feature detection operation is applied to the pixel and its neighboring pixels to determine if the feature is present in the image. If so, the full extent of the detected feature is then determined.

Method and apparatus for feature detection in a workpiece

Fill volume of a liquid in a sealed, transparent container is determined by rotating the container about a transverse axis so as to confine the air to a generally cylindrical air pocket about the transverse axis of rotation. Machine vision methods and apparatus are used to capture an image of the container, including the air pocket, for measuring the size of the air pocket. A common volume of the container is defined as a generally cylindrical region intermediate upright and inverted liquid levels. The common volume and the air pocket volume are used to determine the liquid fill volume so that all measurements are acquired in a central portion of the container having a regular geometric shape.

Non-destructive fill volume measurement system

Growing community of inventors

Albany, OR, United States of America

Cary Steven Kiest