Hewlett-packard Company

Carroll E Morris, Jr

Philip N King

Darrell B Johnsrud

Robert E Balliew

Mark A Mathieu

An algorithm selects probe locations for both test signal probes and ground probes in a short-wire board test fixture. The board test fixture connects a test system to a circuit board under test. The algorithm minimizes ground bounce. The algorithm envisions first superimposing an imaginary grid of squares over the circuit board. Then, ground probe locations are derived so that no more than five test signal probes for each ground probe reside within each of the imaginary squares and so that each critical test signal probe is associated within a preselected distance of a ground probe. In the preferred embodiment, the imaginary square measure 1.4 inches on a side, and the preselected distance is approximately one inch.

Method for control of ground bounce above an internal ground plane in a

A method for use in an in-circuit tester automatically determines which test sequences must be regenerated as a result of a board modification, and automatically regenerates only the test sequences affected by the modification.

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Fort Collins, CO, United States of America

Carroll E Morris, Jr