Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Mozido, Inc.

Caroline Paulus

Joachim Tabary

Damien Barbes

Bahaa Ghammraoui

Guillaume Montemont

Thomas Bordy

Veronique Rebuffel

Jean Rinkel

Andrea Brambilla

Anne-Gaelle Bourdat

Remi Toutain

Fanny Marticke

Anne-Gaëlle Bourdat

Rémi Toutain

A microfluidic device includes a single rigid support and a first unit having a first chamber of nonzero volume delimited by walls of the support. A filter separates the first chamber into a first space and a second space, a first channel made in the support and a second channel. The device also includes a second unit including a second chamber, a third channel. The device further includes a first fluidic transfer channel between the first chamber and the second chamber, made in the support and opening on the one hand into said second chamber and on the other hand at a first bypass node in the second channel. The device including first flow switching means arranged for selecting connection of the first chamber to the exterior only, via the second channel only or to the second chamber only, through the first transfer channel.

Microfluidic device for preparing and analyzing a biological sample

The invention is a method for characterizing an object (), comprising the following steps:

Method for characterizing an object using spectral imaging

A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1&#xb0; to 15&#xb0;, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.

Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum

A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.

Material identification method

The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.

Method of calibrating an X ray diffraction analysis system

The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.

Method for analyzing an object by X-ray diffraction

A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.

Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum

The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.

Collimator for X-ray diffraction spectroscopy, associated device and its use

A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.

Method for characterizing a material

A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.

Diffractometry-based analysis method and associated diffractometer, particularly suitable for samples comprising multiple layers of materials

The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (&#x3b8;); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (&#x3bc;materiau (E, E, &#x3b5;)), a configuration for estimating the density (p) of the material.

Method and apparatus for characterising a material by scattering of electromagnetic radiation

A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

Method of analysing a sample of material by diffractometry and associated diffractometer

A method and device for obtaining a first radiation spectrum diffused through a material, in which the material is exposed to an incident irradiation beam emitted by a radiation source. A first radiation spectrum diffused through the material is measured by means of a main detector, arranged so that its observation field intersects the irradiation beam inside the material. At least one secondary radiation spectrum diffused through the material is measured by means of at least one secondary detector and a measurements matrix (X) is constructed starting from previously measured spectra. The measurements matrix is decomposed in two non-negative matrices, a weights matrix (A) and a spectra matrix (S), where the spectra matrix includes an estimated multiple diffuse radiation spectrum and an estimated primary diffuse radiation spectrum. The device includes a microprocessor and computer program. A computer program product for implementing the method is also provided.

Method of processing radiation spectra diffused through a material in order to obtain a primary diffuse radiation spectrum through said material, associated device and computer program

Growing community of inventors

Grenoble, France

Caroline Paulus