Micron Technology Incorporated

Intel Corporation

Carmine Miccoli

Akira Goda

Kishore Kumar Muchherla

Mark Alan Helm

Gil Golov

Jeffrey S McNeil, Jr

Jeremy Binfet

Giuseppina Puzzilli

Todd A Marquart

Niccolo' Righetti

Niccolo′ Righetti

Christian Caillat

Violante Moschiano

Tommaso Vali

Giuseppe Cariello

Pranav Kalavade

Andrew Bicksler

Walter Di Francesco

Fulvio Rori

Chiara Cerafogli

Srinath Venkatesan

Justin Bates

Ryan Hrinya

Chengbin Sun

A memory device includes a memory array and control logic, operatively coupled to the memory array, to perform operations including causing a read operation to be initiated with respect to a set of target cells, determining whether the read operation has failed, in response to determining that the read operation has failed, obtaining, for each group of adjacent cells, respective cell state information, assigning, based on the cell state information, each target cell of the set of target cells to a respective state information bin of a set of state information bins, determining whether to initiate auto-calibrated corrective read, in response to determining to initiate auto-calibrated corrective read, performing read level offset calibration to determine a set of calibrated read level offsets, and causing the set of target cells to be read using the set of calibrated read level offsets.

Auto-calibrated corrective read

Processing logic in a memory device receives a request to execute a programming operation on a set of memory cells of the memory device. A first set of programming pulses corresponding to a first step voltage level are caused to be applied to one or more wordlines associated with the set of memory cells. The processing logic determines that a programming voltage level associated with a programming pulse of the first set of programming pulses satisfies a condition. A second set of programming pulses corresponding to a second step voltage level is caused to be applied to the one or more wordlines associated with the set of memory cells in response to the condition being satisfied.

Dynamic step voltage level adjustment

Methods, systems, and devices for suspend operations are described. A memory device may perform a write operation including one or more programming phases and one or more verify phases. The memory device may receive a read command while performing the write operation and determine whether the verify phase of the write operation is complete. The memory device may suspend a performance of the write operation in response to determining that the verify phase of the write operation is complete. The memory device may transmit first information for the write operation from a first latch to a volatile memory device in response to suspending the performance of the write operation. The memory device may perform a read operation associated with the read command in response to suspending the performance of the write operation and transferring the first information.

Techniques for suspend operations

A memory component comprises a cyclic buffer partition portion and a snapshot partition portion. In response to receiving a signal that a trigger event has occurred, a processing device included in the memory component performs an error correction operation on a portion of data stored in the cyclic buffer partition portion, copies the data stored in the cyclic buffer partition portion to the snapshot partition portion in response to the error correction operation being successful, and sends the data stored in the cyclic buffer partition portion to a processing device operatively coupled to the memory component in response to the error correction operation not being successful.

Partitioned memory having error detection capability

A system includes a processing device and trigger circuitry to signal the processing device responsive, at least in part, based on a determination that a trigger event has occurred. The system can further include a memory device communicatively coupled to the processing device. The memory device can include a cyclic buffer partition portion having a first endurance characteristic and a first reliability characteristic associated therewith. The memory device can further include a snapshot partition portion coupled to the cyclic buffer partition portion via hold-up capacitors. The snapshot partition portion can have a second endurance characteristic and a second reliability characteristic associated therewith. The processing device can perform operations including writing received data sequentially to the cyclic buffer partition portion and writing, based at least in part on the determination that the trigger event has occurred, data from the cyclic buffer partition portion to the snapshot partition portion.

Separate partition for buffer and snapshot memory

A system includes a processing device and a memory device communicatively coupled to the processing device. The memory device can include a cyclic buffer partition portion and a snapshot partition portion coupled to the cyclic buffer partition portion via hold-up capacitors. The snapshot partition portion can further include a first sub-partition portion having a first programming characteristic and a second sub-partition portion having a second programming characteristic. The processing device can write received data sequentially to the cycle buffer partition portion and write, based at least in part on a determination that a trigger event has occurred, data from the cyclic buffer partition portion to the first sub-partition portion or the second sub-partition portion, or both.

Partitions within snapshot memory for buffer and snapshot memory

A method includes during a first portion of a service life of a memory device, programming at least one memory cell of the memory device to a first threshold voltage corresponding to a desired data state. The method can include during a second portion of the service life of the memory device subsequent to the first portion of the service life of the memory device, programming at least one memory cell of the memory device to a second threshold voltage corresponding to the desired data state. The second threshold voltage can be different than the first threshold voltage.

Threshold voltage based on program/erase cycles

A system includes a memory device having a plurality of groups of memory cells and a processing device communicatively coupled to the memory device. The processing device is be configured to read a first group of memory cells of the plurality to determine a calibrated read voltage associated with the group of memory cells. The processing device is further configured to determine, using the calibrated read voltage associated with the first group of memory cells, a bit error rate (BER) of a second group of memory cells of the plurality. Prior to causing the memory device to perform a copyback operation on the plurality of groups of memory cells, the processing device is further configured to determine whether to perform a subsequent read voltage calibration on at least the second group of the plurality based, at least partially, on a comparison between the determined BER and a threshold BER.

Read voltage calibration for copyback operation

A method includes writing received data sequentially to a particular location of a cyclic buffer of a memory device according to a first set of threshold voltage distributions. The method further includes performing a touch up operation on the particular location by adjusting the first set of threshold voltage distributions of the data to a second set of threshold voltage distributions in response to a determination that a trigger event has occurred. The second set of threshold voltage distributions can have a larger read window between adjacent threshold voltage distributions of the second set than that of the first set of threshold voltage distributions.

Threshold voltage distribution adjustment for buffer

A method includes performing a copyback operation comprising transferring, using an internal processing device, user data and header data corresponding to the user data from a first block of memory in a memory device to a register in the memory device, decoupling the user data from the header data, performing an error correction code (ECC) operation on updated header data using an external processing device, transferring, via the external processing device, the updated header data to the register, and transferring the user data and the updated header data from the register to a second block of memory in the memory device.

Data management during a copyback operation

Instructions can be executed to determine a quantity of logical units that are part of a memory device. The instructions can be executed to operate the logical units with a programming time sufficient to provide a required throughput for storage of time based telemetric sensor data received from a host. The instructions can be executed to operate the logical units with a trim that correspond to the programming time.

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Boise, ID, United States of America

Carmine Miccoli