Cypress Semiconductor Corporation

Carlo Gamboa

Bo Soon Chang

Brett Alan Spurlock

Salvador Padre

A leadframe and semiconductor device package with multiple semiconductor device die paddles for accepting multiple semiconductor devices is disclosed, wherein the leadframe increases semiconductor device density and reduces cost by integrating the multiple dies into a semiconductor device package with a relatively small footprint. The leadframe may include at least one full-metal die paddle and at least one reduced-metal die paddle, which may form a unified or hybrid die paddle. The leadframe may enable electrical coupling of multiple semiconductor devices to a common leadfinger and/or die paddle, where internal leadfingers coupled to the common leadfingers and/or die paddles may receive the electrical coupling means from the semiconductor device. Surfaces of one or more die paddles of the leadframe may be exposed to the outside of the semiconductor device package to enable electrical testing of and/or provide heat dissipation from one or more of the semiconductor devices attached to the leadframe.

Multiple die paddle leadframe and semiconductor device package

A semiconductor device package, a method of fabricating a semiconductor device package and a method of testing an integrated circuit utilizing a semiconductor device package are disclosed. Embodiments create a flip-flop semiconductor device package by coupling a semiconductor device, with a wire-bonded arrangement of conductive pads, in a face-up orientation beneath multiple bent leadfingers. The flip-flop package offers improved signaling properties, durability, reliability, and package density at reduced cost given that the conductive pads of the device couple directly to the bent leadfingers, without requiring the manufacture of a new device or the rerouting of signal paths. Additionally, the flip-flop configuration provides convenient means for exposing surfaces of the device (e.g., to increase heat transfer therefrom, thermal performance of the device, etc.) and/or surfaces of the leadfingers (e.g., to provide test points, wire bondouts, etc.).

Flip-flop semiconductor device packaging using bent leadfingers

A package and packaging method are provided that enable packaging of larger dies and/or smaller packages. Generally, the method includes steps of: (i) reducing a thickness of a portion of a top surface of leads of a leadframe extending into a package being formed; (ii) mounting a die to a paddle of the leadframe, the die extending past an edge of the paddle into a space created by reducing the thickness of the leads; and (iii) encapsulating the die and leadframe, including the reduced portion of the leads, in a molding compound. In one embodiment, the leads are reduced by half-etching the portion of the top surface. Preferably, the method further includes wire bonding pads on the die to etched portions of the leads to electrically couple the die to the leads. Alternatively, wire bonding is between the pads and non-etched portions of the leads. Other embodiments are also disclosed.

Integrated circuit package and packaging method

A method and packaging for semiconductor devices and integrated circuits is disclosed that eliminates warpage stress on packages caused by coefficient of thermal expansion (CTE) mismatch between the device, lead frame or die paddle and a molding compound. Generally, the method includes steps of: (i) mounting the die on which the device is fabricated to a die paddle of a leadframe; and (ii) encapsulating the die on the die paddle and at least a portion of the leadframe in a molding compound, wherein a difference between a first volume of molding compound above a plane of the leadframe and a second volume of molding compound below the plane of the leadframe is sufficiently reduced to substantially eliminate warpage of the finished package due to mismatch of CTEs of the device, lead frame and packaging compound. The die paddle may be etched or reduced to facilitate molding compound flowing under the plane of the leadframe. Other embodiments are also disclosed.

Warpage-compensating die paddle design for high thermal-mismatched package construction

In one embodiment, an integrated circuit package includes a lead frame with a die paddle and several leads. Portions of the lead frame not having an external electrical connection may be thinned such that they may be encapsulated by an electrically insulating packaging material on the back of the lead frame. Portions of the lead frame having external electrical connections may have a thickness such that they are exposed through the packaging material. The lead frame may be covered by an electrically insulating cover to protect components on the lead frame from erroneous electrical contact or electrostatic discharge (ESD) damage.

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Milpitas, CA, United States of America

Carlo Gamboa