Advanced Micro Devices Corporation

Carlo E Barrientos

Peter J Hannan

Christopher C Sander

Dean Marvin

Rudy J Albachten, Iii

A method for constructing a global interconnect model of a device having ambiguous abutments between submodules includes generating a discrete model for each of the submodules, identifying interconnections between the submodules, and defining a plurality of global abutment points for the interconnections between the submodules. Each global abutment point specifies a locus of interconnection points along at least a portion of a boundary of a particular one of the submodules. The discrete models are stitched together based on the global abutment points to construct a global model.

Method and apparatus for constructing a global interconnect model of a device having ambiguous submodule abutments

A method for designing a circuit having a plurality of submodules includes providing a floor plan for the circuit. The floor plan defines boundaries for each of the submodules. A component list identifying internal circuit elements of the submodules and interconnections between the internal circuit elements is provided. A plurality of global abutment points are defined for the interconnections between internal circuit elements of different submodules. Each global abutment point specifies a locus of interconnection points along at least a portion of the boundary of a particular one of the submodules. A program storage device includes a floor plan database, a connectivity database, and program instructions. The floor plan database is adapted to store a floor plan of a circuit having a plurality of submodules. The floor plan defines boundaries for each of the submodules. The connectivity database is adapted to store information identifying internal circuit elements of the submodules and interconnections between the internal circuit elements. The program instructions, when executed by a computer, perform a method, the method comprising defining a plurality of global abutment points for interconnections between internal circuit elements of different submodules. Each global abutment point specifies a locus of interconnection points along at least a portion of the boundary of a particular one of the submodules.

Method and apparatus for specifying global abutment points in a semiconductor device having ambiguous submodule abutments

A computer-implemented method for aiding in the design of an integrated circuit (IC) floorplan. The method comprises receiving a netlist, physical layout information, and timing constraints of the IC and performing timing analysis of the signal paths of the IC. The user selects the set of nets to by analyzed. The timing analysis comprises calculating net delays as a function of the length of the signal paths. The timing analysis further comprises calculating slack times by subtracting from the clock cycle time of the IC the sum of the driven at timing constraint, the needed by timing constraint, and the net delay. Paths which have a slack time greater than a slack failure value are passing nets and paths which have a slack time greater than a slack failure value are failing nets. The slack failure value is user-specifiable and defaults to zero. The method further comprises displaying in a spreadsheet the timing constraints, net delays, and slack times for each path selected, thus providing the designer with complex multi-dimensional feedback. The feedback for each path in the spreadsheet is accompanied by a hyperlink button, which the designer selects in order to graphically display the path on a graphical view of the floorplan. Thus the designer is enabled to relate the non-graphical timing information to a graphical display of the paths and apply his or her intuitive knowledge to make necessary changes to the floorplan. The timing information is further summarily displayed in a histogram, thus providing visual feedback regarding the timing quality of the floorplan. The method provides means for the designer to display failing paths, passing paths, all paths, and paths skipped in timing analysis due to the absence of timing constraints.

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Round Rock, TX, United States of America

Carlo E Barrientos