Infineon Technologies Flash Gmbh & Co. Kg

Carlo Borromeo

Giacomo Curatolo

Rico Srowik

A method for reading a memory cell, wherein the memory cell comprises two source/drain regions and a gate, wherein the source/drain regions are each connected to a respective local bitline, and, wherein one of the source/drain regions of a neighboring memory cell is connected to one of the local bitlines, the other source/drain region of the neighboring memory cell being connected to another local bitline, comprising the steps of connecting the local bitline that connects the source/drain region of the memory cell and the source/drain region of the neighboring memory cell to a first global bitline, connecting the local bitline that connects the other source/drain region of the memory cell to a second global bitline, connecting the local bitline that connects the other source/drain region of the neighboring memory cell to one of a plurality of local power rails, applying a gate potential to the gate of the memory cell, applying a potential to the first global bitline and applying another potential to the second global bitline, and measuring the current flowing through the first global bitline.

Non-volatile semiconductor memory and method for reading a memory cell

A cell arrangement comprising a memory cell arranged in parallel to a first capacitor is charged to a first voltage potential. A second capacitor is charged to a second voltage potential, which is higher than the first voltage potential. The second capacitor is connected to the cell arrangement while the voltage over the cell arrangement comprising the first capacitor is kept constant. The resulting current from the second capacitor through the memory cell is used to detect the state of the memory cell.

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Dresden, Germany

Carlo Borromeo