Seagate Technology Incorporated

Carl John Naley

Dennis Quinto Cruz

Tommy Joe Metzner

Nathaniel Patrick Sheppleman

A test baseplate is configured to support and expose at least one storage device component to particle evacuation and particle analysis. The test baseplate includes a base having an upper surface that extends between an outer peripheral wall and an inner peripheral wall and having a lower surface defined by the inner peripheral wall. The test baseplate also includes a top clamp configured to be fastened to the upper surface of the base to secure the at least one storage device component to the base.

Growing community of inventors

Decorah, IA, United States of America

Carl John Naley