Analog Devices Global Unlimited Company

Analog Devices Global

Camille Louis Huin

David Frank Bolognia

Michael C W Coln

Gary Carreau

Yoshinori Kusuda

Brian W Hall

Dermot G O'Keeffe

Tudor M Vinereanu

Donal Bourke

Sean Patrick Kowalik

Liam Patrick Riordan

Gustavo Castro

Simon Nicholas Fiedler Basilico

Scott Andrew Hunt

Paul Vincent Errico

Amplifier systems for measuring a wide range of current are provided herein. In certain embodiments, an amplifier system includes a controllable sensing circuit, a first amplifier including an output configured to drive a device under test (DUT) through the controllable sensing circuit, and a second amplifier including an input coupled to the controllable sensing circuit and operable to generate a measurement signal indicating an amount of measured current of the DUT. The amplifier system further includes a control circuit operable to control a configuration or mode of the controllable sensing circuit suitable for a particular type of DUT.

Amplifier systems for measuring a wide range of current

An optical device package is disclosed. The optical device package includes a substrate that passes light at an optical wavelength. The optical device package also includes an optical device assembly that is mounted to the substrate. The optical device assembly comprises an optical device die. The optical device die has a first surface that is mounted to and facing the substrate and a second surface that is opposite the first surface. The optical device package further includes a molding compound that is disposed at least partially over the second surface of the integrated device die.

Optical sensor package

Subject matter herein can include identifying a biochemical test strip assembly electrically, such as using the same test circuitry as can be used to perform an electrochemical measurement, without requiring use of optical techniques. The identification can include using information about a measured susceptance of an identification feature included as a portion of the test strip assembly. The identification can be used by test circuitry to select test parameters or calibration values, or to select an appropriate test protocol for the type of test strip coupled to the test circuitry. The identification can be used by the test circuitry to validate or reject a test strip assembly, such as to inhibit use of test strips that fail meet one or more specified criteria.

Susceptance measurement for identifying biochemical sensors

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Taipei, Taiwan

Camille Louis Huin