International Business Machines Corporation

Caleb James Wesley

Bhyrav M Mutnury

Moises Cases

Pravin S Patel

Nam Huu Pham

Bradley Donald Herrman

Erdem Matoglu

Kent Barclay Howieson

Jinwoo Choi

Navraj Singh

A method for electrical design space exploration includes receiving a template for an electrical design. Design component parameters associated with at least one component in the electrical design are also received. Weighted factors are assigned to design complexity parameters of the electrical design. The parameters of the complexity can include at least one of following: whether the electrical design is known, a number of the design component parameters, a level of interaction among the design component parameters, a time constraint and a memory restriction of a simulation, and whether a statistical analysis or a worst case approach is used to analyze an output of the simulation. A simulation approach for design space exploration of the electrical design is selected based on the weighted factors for the parameters of the complexity of the electrical design. The simulation is performed based on the selected simulation approach.

Electrical design space exploration

Identifying an optimized test bit pattern for analyzing electrical communications channel topologies, including: ranking according to channel quality, from worst to best, a set of channel topologies for an electrical communications channel; and for each ranked channel topology beginning with the worst, carrying out the following steps in an iterative loop until a concatenated test bit pattern and a previously optimized test bit pattern are functionally equally fit: concatenating to a previously optimized test bit pattern an additional test bit pattern; optimizing the concatenated test bit pattern values for a next ranked channel in the subset, leaving the optimized values of the previously optimized test bit pattern unchanged; and comparing through use of a fitness function the relative qualities of the previously optimized test bit pattern and the optimized concatenated test bit pattern.

Identifying an optimized test bit pattern for analyzing electrical communications channel topologies

A method, system, and computer program product for exploring and optimizing an electrical design space. A computer receiving a design space assigns a plurality of initial values (random or predetermined) for optimizing the design space. A particle swarm containing a plurality of particles is created and an optimization of the design space is then performed using the assigned initial values. Following completion of optimization, the global best and personal best for each particle are updated. Velocity vectors and position vectors of the design space are then updated before the computer performs the optimization process again. The process loops, continually updating global and personal bests and velocity and position vectors until a termination criteria is reached. Upon reaching the termination criteria, the best fitness of each particle of the swarm is assigned as an optimized design space. In an alternate embodiment, the particle with the worst target fitness may be assigned.

Swarm intelligence for electrical design space modeling and optimization

An apparatus having reduced noise coupling includes a core layer having an upper and lower surface, the upper and lower surface each including a copper sheet layer, a pre-preg layer having an upper surface and a lower surface, the upper surface of the pre-preg layer coupled to the lower surface of the core layer, a core insulating layer having an upper surface and a lower surface, the upper surface of the core insulating layer coupled to the lower surface of the pre-preg layer, a return current reference layer disposed on the lower surface of the core insulator layer and high-speed signal traces disposed on the upper surface of the core insulating layer, each of the high speed signal traces disposed on a pedestal defined by a section of the pre-preg layer and the core insulating layer, each pedestal being separated by an air gap disposed between adjacent pedestals.

Reducing noise coupling in high speed digital systems

A method for testing a printed circuit board to determining the dielectric loss associated with the circuit board material relative to a standard. Dielectric losses in the material generate heat when a high frequency electronic signal, such as a microwave frequency signal, is communicated through a microstrip that is embedded within the printed circuit board. The temperature or spectrum at the surface of printed circuit board is measured and compared against the temperature or spectrum of the standard to determine whether the material under test is acceptable. While various temperature measurement devices may be used, the temperature is preferably measured without contacting the surface, such as using an infrared radiation probe.

Method for validating printed circuit board materials for high speed applications

Methods and systems for reducing noise coupling in high-speed digital systems. Exemplary embodiments include a method, including etching a plurality of high speed signal traces onto a core insulating layer, forming trenches on respective sides of the plurality of high speed signal traces, thereby removing insulating material adjacent to the plurality of high speed signal traces and forming pedestals having remaining insulating material, the plurality of high speed signal traces disposed on and coupled to the remaining insulating material, coupling pre-preg material on the high speed signal traces, removing the pre-preg material adjacent the trenches, thereby retaining the pre-preg material aligned with the high speed signal traces, and heating and pressing a core layer to the pre-preg layer, and heating and pressing the pre-preg layer to the core insulating layer.

Growing community of inventors

Winston Salem, NC, United States of America

Caleb James Wesley