Altera Corporation

Caleb Crome

Naresh U Mehta

Tajana Simunic

Cameron R McClintock

James A Watson

A method and device for testing and manufacturing integrated circuits such as microprocessors, memories, ASICs, programmable logic, and other types of integrated circuits. A test system is designed to test the relevant integrated circuit. A device under test emulator responds to the test system. If modifications are needed, the test system can be modified, and used to test actual devices.

Method and device for test vector analysis

A system and method for making and using integrated circuits using a modeling system. The system utilizes a pin test buffer. The pin test buffer inputs external inputs to a pin, and outputs to the same pin from the device. If contention is noted between the system inputs to the pin, and outputs from the device to the pin, contention error notices are provided to the user.

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Mt. View, CA, United States of America

Caleb Crome