Skhynix Inc.

Byungkuk Yoon

Youngjun Park

Youngjun Ku

Seokwoo Choi

Junil Moon

A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.

Growing community of inventors

Icheon-si, South Korea

Byungkuk Yoon