Skhynix Inc.

Byoung Young Kim

Cheul Hee Koo

Jong Woo Kim

Byoung In Joo

Young Cheol Shin

A semiconductor memory device includes a memory block including a plurality of memory cells programmed to a plurality of program states during a program operation, a voltage generator to generate and apply a program voltage and a select line voltage to the memory block during the program operation, and a read and write circuit to temporarily store program data during the program operation and control a potential of bit lines of the memory block based on the temporarily stored program data. The voltage generator generates the select line voltage as a first select line voltage during a first program operation on some program states among the plurality of program states, or as a second select line voltage for which a potential is lower than a potential of the first select line voltage during a second program operation on remaining program states among the plurality of program states.

Semiconductor memory device and method of operating the same

A semiconductor memory device includes a memory cell array, a peripheral circuit, and control logic. The memory cell array includes a plurality of memory cells. The peripheral circuit is configured to perform a first operation, corresponding to a first command, on the memory cell array. The control logic is configured to control the first operation of the peripheral circuit. The control logic is configured to control the peripheral circuit to suspend the performance of the first operation and perform a second operation corresponding to a second command, in response to the second command being received while the first operation is being performed.

Semiconductor memory device and controller

A program method of a nonvolatile memory device includes a pre-program verify step for verifying a threshold voltage of a selected memory cell; a step of setting a bit line voltage of the selected memory cell according to the threshold voltage of the selected memory cell which is determined through the pre-program verify step; a step of applying a program voltage to the selected memory cell set with the bit line voltage; and a post-program verify step for verifying a programmed state of the selected memory cell applied with the program voltage.

Program method of nonvolatile memory device for having dense threshold voltage distribution by controlling voltage of bit line according to threshold voltage of memory cell

The invention relates to a semiconductor memory device and an operating method thereof. The semiconductor memory device includes a first plane and a second plane each including a plurality of memory blocks, a first read and write circuit and a second read and write circuit suitable for sensing and temporarily storing data programmed into the first and second planes, respectively, and a control logic suitable for controlling the first and second read and write circuits to perform a read operation on the first and second planes, respectively, wherein the control logic controls the first and second read and write circuits to set the temporarily stored data as setting data, performs a new read operation to store new data, or maintains the temporarily stored data, depending on whether the first and second planes are in an LSB program state or an MSB program state.

Semiconductor memory device and operating method thereof

A semiconductor device and a method of operating the same are provided. The method includes determining whether a read operation on a selected page is a beginning read operation on the selected page; performing a least significant bit (LSB) read operation on the selected page when the read operation is the beginning read operation on the selected page according to a determination result, and performing a first sub-read operation on the selected page according to a result of the LSB read operation; and performing a second sub-read operation including the LSB read operation or a most significant bit (MSB) read operation on the selected page according to stored program state data when the read operation is not the beginning read operation on the selected page according to the determination result.

Semiconductor device having multi-level cell and method of reading the same

A page buffer circuit includes: a main latch unit configured to have a main latch value which is dependent on a sub latch output signal, and output the main latch value to a first node; a sub latch unit configured to latch a voltage of a second node as a sub latch value in response to a storage enable signal, and generate the sub latch output signal according to the sub latch value when an output enable signal is activated; and a voltage determination unit connected between the first node and the second node, and configured to electrically connect or disconnect the first node to or from the second node in response to the storage enable signal, and determine a voltage level of the second node in response to the storage enable signal.

Growing community of inventors

Icheon-si, South Korea

Byoung Young Kim