Samsung Electronics Co., Ltd.

Ewha University-Industry Collaboration Foundation

Byoung-Ju Choi

Ki-Cheol Lee

Yong-Hun Kim

Kwang-Hyun La

Sung-Bong Kang

Joo-Young Seo

Ah-Young Sung

Ji-Hyun Park

Jang-Hyuk An

In a method of analyzing a fault and/or error of an electronic system according to some example embodiments, a system call that accesses a hardware is replaced with a hooking system call including a code that executes the system call and a code that obtains monitoring information, the monitoring information including system call execution information and hardware performance information is obtained by executing the hooking system call when the hooking system call is called instead of the system call, and the monitoring information is recorded to analyze the fault/error of the electronic system based on the monitoring information.

Method of analyzing a fault of an electronic system

Provided is an apparatus and method for automatically extracting an interface of embedded software. The method defines an interface of embedded software as a test item for test of the interface of the embedded software, and generates an interface symbol corresponding to the defined test item. The location of the interface symbol is determined, and a test case is generated based on the interface symbol and its location in the software. Embodiments of the invention thus facilitate the testing of software at interfaces between layers in the software.

Apparatus and method for automatically extracting interface of embedded software

Embodiments of the invention provide a device and a method for automatically testing embedded software, and more specifically for testing interfaces between layers of the embedded software. In one embodiment, the device includes: an emulator; a server including embedded software; an evaluation board configured to download the embedded software from the server and controlled by the emulator; and a host system configured to receive the embedded software from the server and automatically generate test cases for testing the embedded software using the emulator.

Device and method for testing embedded software using emulator

Growing community of inventors

Gangnam-gu, South Korea

Byoung-Ju Choi