Micron Technology Incorporated

Bryce A Gardiner

Eric J Stave

Luis Nathan Perez Acosta

Interposers for use in testing and characterizing memory devices, such as memory devices including decision feedback equalization circuitry, are disclosed herein. In one embodiment, an apparatus includes an interposer having a first interface couplable to a memory device, a second interface couplable to one or more testers, and a channel circuit between the first interface and the second interface. The channel circuit is configurable, via one or more resistive elements, to change a measurable value of a signal transmitted between the first interface and the second interface via the channel circuit.

Interposers for memory device testing and characterization, including interposers for testing and characterizing decision feedback equalization circuitry of DDR5 memory devices

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Meridian, ID, United States of America

Bryce A Gardiner