Texas Instruments Corporation

Bryan S Reese

Kenneth K Colson

With a controlled scanning device (5, 6, 7), such as a FLIR, the scene which provides a modulated source is scanned with the scanning frequency being changed. This results in scanning of the scene with two different known scanning frequencies. By knowing the change in sampling frequency and correlating the changes in the Fourier frequency results in a spectrum analyzer (13), the frequency of the modulated source, including a source modulated at frequencies higher than the sampling rate of the sensor, is remotely measured.

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Mesquite, TX, United States of America

Bryan S Reese