Teraview Limited

Bryan Edward Cole

Donald Dominic Arnone

Craig Michael Ciesla

Simon Chandler

Darius M Sullivan

Julian Alexander Cluff

Philip Francis Taday

Michael John Withers

Vincent Patrick Wallace

Brian Robertson

Michael John Evans

William R Tribe

Anthony J Fitzgerald

John Baker

Darius Sullivan

Michael C Kemp

Ruth Mary Woodward

Stefano Barbieri

A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Test system with adjustable delay line and radiation feedback control

A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.

Test system

Test system for testing the integrity of an electronic device

A reflectometer for allowing a test of a device. The reflectometer comprises a source of pulsed radiation, a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source, a second photoconductive element configured to receive a pulse, a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element, and a termination resistance provided for the transmission line configured to match the impedance of the transmission line.

A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.

Imaging apparatus and method

A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

Imaging techniques of pharmaceutical preparations such as tablets are disclosed. The techniques combine the measurement of reflected/transmitted terahertz radiation originating from within the tablet and data analysis localized in frequency and time in order to enable a three dimensional image indicating composition to be obtained.

Imaging techniques and associated apparatus

A probe array () for an imaging system for examining an object () comprising at least one emitter () for emitting radiation, a plurality of detectors () for detecting radiation and means for directing radiation emitted by the at least one emitter () to the object () and for directing radiation reflected from the object () to at least two of the plurality of detectors () wherein in use the emitted radiation is scanned by means () across the object ().

TeraHertz probe array imaging system

A THz radiation probe () for examining an object (), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (), said probe further comprising at least one THz emitter (), directing means () for directing THz radiation emitted from said emitter to said object via an aperture () located at said first portion and subsequently from said object to at least one THz detector () and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction ().

Scanning terahertz probe

Method and apparatus for investigating a sample particularly a pharmaceutical tablet. An emitter and/or the sample are initially positioned so that the emitter is at a predetermined distance and normal angle to a first point on a surface of the sample. The emitter then irradiates the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz at a plurality of points on the surface of the sample. Relative motion is possible between the emitter and the sample so that the surface of the sample can be tracked to maintain the predetermined distance and normal angle at each of the plurality of points, and allow radiation transmitted and/or reflected from the sample at the plurality of points to be detected. This has particular application to imaging the structure or composition of a coating on a pharmaceutical tablet.

Method and apparatus for investigating a non-planar sample

Apparatus and method for detecting an explosive material, involving irradiating an object with a continuous wave (CW) or pulsed beam of Terahertz radiation, preferably in the frequency range of 100 GHz to 100 THz and detecting radiation transmitted and/or reflected from the object. A spectrum is constructed from the detected radiation, which is indicative of a fundamental property of the explosive material. This constructed spectrum is compared with one or more known spectra of explosive materials to determine whether a likeness exists.

Spectroscopy apparatus and associated technique

Method and apparatus for irradiating a sample with Terhertz radiation and detecting non-specular radiation in order to characterise the internal structure of the sample. Terahertz radiation specularly reflected from the surface is minimised so that it does not mask the weaker signal originating from the internal structure of the sample.

Method and apparatus for investigating a sample

An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (); and first and second contact elements () separated by a photoconducting gap provided by said photoconducting material (), for applying a bias across said photoconducting gap, wherein at least one of said first and second contact elements () comprises a resistive element () for restricting current flow between said first and second contact elements in a second range of frequencies lower than the first range of frequencies.

Growing community of inventors

Cambridge, United Kingdom

Bryan Edward Cole