Agilent Technologies, Inc.

Bryan David Miller

Gregor T Overney

August Jon Hidalgo

A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.

Time of flight mass spectrometry method and apparatus

Methods for specifying the layout of a MALDI sample plate are provided. In general, the methods involve creating a file containing sample plate layout parameters that describe the layout of a MALDI sample plate, and storing the file on a computer readable medium prior to placement of the MALDI sample plate into a MALDI ion source. In many embodiments, the file includes information about the size or shape of the sample plate, or information about the size, shape or position of a sample on the sample plate. In many embodiments, a MALDI sample plate is placed in a MALDI ion source and a stored layout file for the sample plate is accessed and used to position an area of the sample plate in a laser beam. The subject methods, kits and apparatus find use in a variety of different mass spectrometry applications.

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Cupertino, CA, United States of America

Bryan David Miller